An approach of the worst case analysis of the analog electronic circuits based on the circuit description in parameter space is proposed. A DC, AC or transient worst-case analysis can be performed only testing the circuit for the vertices of a polytope in conjunction with a circuit simulator or computational environment. In order to validate and show the effectiveness of this approach, DC worst...

---Fault diagnosis of analog circuits is essential for analog and mixed-signal circuits testing and maintenance. In this paper, a new method for multiple fault diagnosis in linear analog circuits is proposed based on the large change sensitivity analysis and ambiguity group locating technique. Test equation establishes the relationship between the measured responses and deviations of faulty par...

Title of dissertation: HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS FOR MODERN SATELLITE RECEIVERS: DESIGN VERIFICATION TEST AND SENSITIVITY ANALYSIS Seokjin Kim Doctor of Philosophy, 2008 Dissertation directed by: Dr. Martin Peckerar Department of Electrical and Computer Engineering Mixed-signal System-on-chip devices such as analog-to-digital converters (ADC) have become increasingly prevalent in ...

In this paper we discuss and compare two feature extraction techniques: histogram-based and Principal Component Analysis. Comparison is done on an analog filter fault diagnosis example performed in the frequency domain. Both techniques are implemented in a neural network system for the off-line diagnosis of electronic analog and mixed-signal circuits. The numerical and experimental examples of ...

This paper proposes a method for analog fault diagnosis using neural networks. The primary focus of the paper is to provide robust diagnosis using a mechanism to deal with the problem of component tolerances and reduce testing time. The proposed approach is based on the k-fault diagnosis method and artificial backward propagation neural network. Simulation results show that the method is robust...

This paper proposes a static test approach suitable for built-in-self-test (BIST) of Analog-to-digital converter Intellectual Property (IP). Static parameters (INL, DNL, gain, offset) are tested without using test equipment. The proposed BIST structure is applicable for testing models of analog-to-digital converters up to 12bits of resolution. Comparison results with dynamic test equipment vali...

Analog to digital converters are Mixed signal devices. With the increasing popularity of these devices , it is important to get more faster and accurate device. Along with design, testing of ADC plays major role . Static and Dynamic methods are available for ADC testing. Ideal ADC itself has quantization error. A NonIdeal ADC consists many other errors like offset error, Gain error, DNL, INL,EN...

In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both static and dynamic are revised and discussed. Regarding the static test it is shown that a new technique based on the use of small triangular waves superimposed with a variable offset value as input signal, reduces dramatically the test duration. This histogram based technique can be implemented by u...

This paper presents an analog built-in testing (BIT) architecture and its implementation. It enables the frequency response and harmonic distortion characterizations of an integrated device-under-test (DUT) through a digital off-chip interface. External analog instrumentation is avoided, reducing test time and cost. The proposed on-chip testing scheme uses a digital frequency synthesizer and a ...

Linearity is an important measure of an analog amplifier performance and normally measured by the 3rd order inter-modulation product (IP3) under a two-tone test. In this paper, we propose a test scheme that generates test tones using a built-in direct-digital synthesizer (DDS). Radio Frequency (RF) test tones are generated by converting the DDS output to RF using a built-in analog mixer that ca...