نتایج جستجو برای: analytical run length

تعداد نتایج: 574744  

2002
Evan Kirshenbaum

This paper describes the results of using genetic programming to evolve models that predict the throughput in disk arrays. The results are compared to previous hand-crafted analytical and automatically-generated interpolation-based device models. An analysis is performed to investigate the optimality of the run parameters chosen as well as to discover whether the approach has the tendency to ov...

2010
Martin Haugh

In these notes we describe how to measure the confidence we have in our Monte-Carlo estimates. In particular, we use he Central Limit Theorem to construct confidence intervals for the quantity we are truing to estimate. We also describe methods to estimate the number of samples that are required to achieve a given confidence level.

2004
Dong-Hui Xu Arati S. Kurani Jacob D. Furst Daniela S. Raicu

With the dramatic increase of 3D imaging techniques, there is a great demand for new approaches in texture analysis of volumetric data. In this paper, we present a new approach for volumetric texture analysis using a runlength encoding matrix and its texture descriptors. We experiment with our approach on the volumetric data generated from two normal Computed Tomography (CT) studies of the ches...

2013
Zekai Şen Z. Şen

Abstract – Various problems in physics and engineering lead to the problem of runlength probability distribution function (pdf) in a finite time series. In this study to find the pdf of run-lengths in such a series, first infinite sequence properties are reviewed and then finite series run length pdf is derived on the basis of simple set theory. This paper presents the derivation of exact run l...

Journal: :Quality and Reliability Eng. Int. 2015
Shovan Chowdhury Amitava Mukherjee Subha Chakraborti

Mukherjee and Chakraborti 1 proposed a single distribution-free (nonparametric) Shewhart-type chart based on the Lepage 2 statistic for simultaneously monitoring both the location and the scale parameters of a continuous distribution when both of these parameters are unknown. In the present work, we consider a single distribution-free CUSUM chart, based on the Lepage 2 statistic, referred to as...

2007
Gregory W. Wornell Uri Erez Hiroyuki Ishii Amos Lapidoth Emin Martinian Elif Uysal Chen-Pang Yeang Anthony Accardi Lane Brooks Venkat Chandar Vijay Divi Everest Huang Ying-Zong Huang Ashish Khisti Urs Niesen Maryam Shanechi Charles Swannack Tricia Mulcahy

2008
Ali Mashat Deeb Olgierd Hryniewicz

Increased competition on the global market forces producers to follow policies leading to finite production runs. This situation requires implementation of a new type of inspection procedures with the aim to improve or sustain production quality levels. One of the most important aspects in the design of inspection processes is the specification of inspection intervals. This paper provides a sim...

1996
Boaz Cohen Its'hak Dinstein Moshe Eyal

A fast, reliable, and objective system for computerized classification of color textured perthite images is proposed. Computerized classification of perthite textures enables large scale comparative perthite texture studies. In order to locate a perthite crystal’s borders, color and texture features are combined in a pixel classification segmentation operation, followed by probabilistic relaxat...

Journal: :Quality and Reliability Eng. Int. 2014
Philippe Castagliola Shu Wu Michael B. C. Khoo Subha Chakraborti

The performance of attributes control charts (such as c and np charts) is usually evaluated under the assumption of known process parameters (i.e., the nominal proportion of nonconforming units or the nominal number of nonconformities). However, in practice, these process parameters are rarely known and have to be estimated from an in-control phase I data set. In this paper, we derive the run l...

1999
Zsigmond Nagy Kenneth Zeger

The capacity C(3) 0;1 of a 3-dimensional (0; 1) run length constrained channel is shown to satisfy 0:522501741838 C(3) 0;1 0:526880847825 . The authors are with the Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla CA 92093-0407. Email: fnagy,[email protected] . The research was supported in part by the National Science Foundation.

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