One major drawback identified in atomic force microscopy imaging is the dependence of the image’s precision on the shape of the probe tip. In this paper a simple algorithm is proposed to provide artifact identification signaling in-situ tip features in atomic force microscopy images. The base of the identifications lied when the angle formed between two scanned points was kept the same as the t...

The adsorption of two kinds of porphyrin (Cu-TBPP) and perylene (PTCDA) derived organic molecules deposited on KBr and Al2O3 surfaces has been studied by non-contact force microscopy in ultra-high vacuum, our goal being the assembly of ordered molecular arrangements on insulating surfaces at room temperature. On a Cu(100) surface, well ordered islands of Cu-TBPP molecules were successfully imag...

Constraints for the constants of hypothetical Yukawa-type corrections to the Newtonian gravitational potential are obtained from analysis of neutron scattering experiments. Restrictions are obtained for the interaction range between 10 −12 and 10 −7 cm, where Casimir force experiments and atomic force microscopy are not sensitive. Experimental limits are obtained also for non-electromagnetic in...

Atomic force microscopes typically require knowledge of the cantilever spring constant and optical lever sensitivity in order to accurately determine the force from the cantilever deflection. In this study, we investigate a technique to calibrate the optical lever sensitivity of rectangular cantilevers that does not require contact to be made with a surface. This noncontact approach utilizes th...

General energy approaches have been applied to study the single-domain polarization reversal induced by the voltage-modulated Atomic Force Microscopy (AFM) in ferroelectric single crystals and thin films. Topographic analysis of energy surfaces in the subspace of domain dimensions is performed, and energy evolutions under an external bias are elucidated. This has let to successfully describe al...