نتایج جستجو برای: atomic force microscopy afm

تعداد نتایج: 429884  

Journal: :Micron 2008
Susan G W Kaminskyj Tanya E S Dahms

We review the use of scanning electron microscopy (SEM), atomic force microscopy (AFM) and force spectroscopy (FS) for probing the ultrastructure, chemistry, physical characteristics and motion of fungal cells. When first developed, SEM was used to image fixed/dehydrated/gold coated specimens, but here we describe more recent SEM developments as they apply to fungal cells. CryoSEM offers high r...

2007
Josef Madl Sebastian Rhode Gerhard J. Schütz Peter Hinterdorfer Gerald Kada

High resolution atomic force microscopy (AFM) can be performed simultaneously with optical microscopy techniques, such as fluorescence or differential interference contrast (DIC) microscopy. The combined methodologies provide complementary information about the studied sample which establishes the basis for a better understanding of physiological processes and the function of biomolecules, and ...

Aliakbar Tarlani Fatemeh Darkhosh

Titanium oxide nanoparticles were synthesized via a solvothermal treatment of titanium isopropoxide in the presence of L-lysine (lysine). The prepared nanostructures characterized by atomic force microscopy (AFM), X-ray diffraction (XRD), thermogravimetric analysis (TGA), diffraction scanning calorimetry (DSC), scanning electronic microscopy (SEM), transmission electron microscopy (TEM) and...

2005
Y. Sugimoto

Non-contact atomic force microscopy (NC-AFM) is a powerful tool for the atomic level observation of various kinds of surfaces including even insulators, and it has been rapidly developed [1]. While the main observable value in the scanning tunneling microscope (STM) is a tunneling current between a tip and a surface, the main observable value in NC-AFM is a frequency shift of the cantilever osc...

Journal: :Optics letters 2009
Graeme A Hill James H Rice Stephen R Meech Duncan Q M Craig Paulina Kuo Konstantin Vodopyanov Michael Reading

Submicrometer IR surface imaging was performed with a resolution better than the diffraction limit. The apparatus was based on an IR optical parametric oscillator laser and a commercial atomic force microscope and used, as the detection mechanism, induced resonant oscillations in an atomic force microscopy (AFM) cantilever. For the first time to our knowledge this was achieved with top-down ill...

Journal: :Advances in physiology education 2015
Filomena A Carvalho Teresa Freitas Nuno C Santos

Atomic force microscopy (AFM) is a useful and powerful tool to study molecular interactions applied to nanomedicine. The aim of the present study was to implement a hands-on atomic AFM course for graduated biosciences and medical students. The course comprises two distinct practical sessions, where students get in touch with the use of an atomic force microscope by performing AFM scanning image...

2007
David Alsteens Etienne Dague Claire Verbelen Guillaume Andre Grégory Francius Yves F Dufrêne

Recent advances in atomic force microscopy (AFM) are revolutionizing our views of microbial surfaces. While AFM imaging is very useful for visualizing the surface of hydrated cells and membranes on the nanoscale, force spectroscopy enables researchers to locally probe biomolecular forces and physical properties. These unique capabilities allow us to address a number of questions that were inacc...

2007
Josef Madl Sebastian Rhode Gerhard J. Schütz Peter Hinterdorfer Gerald Kada

High resolution atomic force microscopy (AFM) can be performed simultaneously with optical microscopy techniques, such as fluorescence or differential interference contrast (DIC) microscopy. The combined methodologies provide complementary information about the studied sample which establishes the basis for a better understanding of physiological processes and the function of biomolecules, and ...

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