a r t i c l e i n f o Keywords: High-power LED lamp Step-stress accelerated test Subsystem isolation method Lifetime Degradation Mechanism The lifetimes of high-power light-emitting diode (LED) lamps are investigated by step-stress accelerated test. The entire lamp is divided into three subsystems, namely, the LED light source, the driver, and the mechanical fixture. Step-stress accelerated tes...
