Article history: Received 26 June 2016 Accepted 6 July 2016 Available online xxxx Degradation mechanism of foldable thin film transistors (TFTs) is investigated experimentally by electrical, mechanical and electrical–mechanical hybrid stress experiments. Mechanical and electrical stress environment was set for foldable TFTs and the degradation effect according to the applied stress is investiga...

the present study examined the effect of packaging film on the quantitative and qualitative properties of button mushrooms. the three types of packaging tested were a clear polyvinyl chloride box, polyvinyl chloride stretch film and biaxially-oriented polypropylene film (bopp). the five types of moisture absorbers examined were silica gel (2.5 g, 1.25 g), sodium chloride (2.5 g, 1.25 g), and si...

over the past decade, many applications were intended for filtration by membrane technology especially the thin film composite (tfc) membranes. in advanced developments of thin film membranes, an attempt was made to spread a new generation of membranes called thin film nano composite (tfn) membranes. however, in the last generation of tfns, an ultrathin selective film of nanoparticles is coated...

If a tangle, K ⊂ B, has no planar, meridional, essential surfaces in its exterior then thin position for K has no thin levels.

– gafchromic xrct radiochromic film is a self developing high sensitivity radiochromic filmproduct which can be used for assessment of delivered radiation doses which could match applications suchas computed tomography (ct) dosimetry. the dose response of gafchromic xrct radiochromic film hasbeen measured with reflectance spectrophotometry and desktop scanners. the film automatically changescol...

in this research, tellurium (te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 k. the thickness of the film was determined by rutherford backscattering spectroscopy. the influence of the thickness on the structural, morphological and molecular bonds was characterized using xrd, scanning electron microscope, and raman spectroscopy. the xrd...

A desired reflectance profile versus frequency (wavenumber) can be directly Fourier transformed into the index of refraction profile as a function of thickness which would produce the desired spectral reflectance profile. This tool has existed for some years now but does not seem to be in common use. This paper lays out some of the principles to aid in making the process more understandable, in...

The focus of this thesis is to analyze cost trends and government incentives in the California PV market during 2007-2008. The data show that pre-rebate system costs increased in California during this time period and that this was driven by a surge in worldwide module cost. Systems employing thin film technology did not exhibit a downward impact on cost, which contradicts historical and techno...

This paper reports the results of electrical characterization of aluminum thin films. Uniform Al thin films were deposited by physical vapor deposition (PVD) technique on glass substrates. The electrical resistivity of the films as a function of film thickness was studied. These parameters have been measured by four-point probe method. The electrical resistivity was obtained by the measurement ...

We have utilized a transmission ratio (TR) between curtain-shaped (Curtain) Mura and non-Mura zones as a key parameter to characterize the optical appearance of Curtain Mura occurred on a 13.3-in TFT–TN panel (Mura sample) after bonding process to place silicon-based driver-IC chips on one of the panel substrates using anisotropic conductive film as a binder (COG ACF process). Our measured TRs ...