Advances in semiconductor technology and design automation, together with increased market competition, have driven engineers to achieve higher levels of integration, with shortened development cycles. Consequently, verification and analysis are becoming a major bottleneck for timely design of complex systems. The panelists and the audience will explore silicon debug and its impact on the desig...

A new VLSI design center VDEC spearheaded by Tokyo University and supported by the Japanese Government is about to alter the course of the microlectronic systems design education at Japanese Universities. The industrial support for microelectronic education and how a new and innovative Japanese University specializing in Computer Science and Computer Engineering uses projects in its curriculum ...

The test problem increasingly affects system design process, related costs and time to market. Requirements from VLSI/WSI manufacturers are for fast and reliable testability tools, with the possibility of their introduction in early phases of design. This paper presents a global toolset architecture for testability analysis and test pattern generation. Three abstraction levels are considered in...