نتایج جستجو برای: magnetic force microscope

تعداد نتایج: 557449  

2014
Oscar Iglesias-Freire Jeffrey R. Bates Yoichi Miyahara Agustina Asenjo

Useful sample information can be extracted from the dissipation in frequency modulation atomic force microscopy due to its correlation to important material properties. It has been recently shown that artifacts can often be observed in the dissipation channel, due to the spurious mechanical resonances of the atomic force microscope instrument when the oscillation frequency of the force sensor c...

Journal: :Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 2014

Journal: :Review of Scientific Instruments 2010

Journal: :European Journal of Physics 2000

Journal: :Review of Scientific Instruments 1993

Journal: :Precision Engineering 1996

Journal: :Applied Physics Letters 2010

Journal: :Review of Scientific Instruments 2006

1998
Z. Zhang P. C. Hammel M. L. Roukes J. R. Childress

We report mechanical detection of ferromagnetic resonance ~FMR! signals from microscopic Co single layer thin films using a magnetic resonance force microscope ~MRFM!. Variations in the magnetic anisotropy field and the inhomogeneity of were clearly observed in the FMR spectra of microscopic Co thin films 500 and 1000 Å thick and ;403200 mm in lateral extent. This demonstrates the important pot...

1999
Rajeev J. Ram Charles H. Cox Edgard F. Goobar Mathew C. Abraham Harry Lee Steven G. Patterson Farhan Rana

Mathew C. Abraham, Professor Rajeev J. Ram There exists a substantial expertise in making extremely precise point-to-point current and potential difference measurements, however, at present there is no technique available to image the flow of currents in devices. Below we report on a preliminary investigation into using a magnetic force microscope (MFM) as a tool to render current contrast images.

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