A novel current-estimation approach is developed to support the analysis of electromigration failures in power supply and ground busses of CMOS VLSI circuits. It uses the original concept of probabilistic simulation to e ciently generate accurate estimates of the expected current waveform required for electromigration analysis. As such, the approach is pattern-independent and relieves the desig...

Luis E. Amaya, Philip T. Krein, Farid N. Najm Coordinated Science Laboratory, University of Illinois at Urbana-Champaign 1308 West Main Street Urbana, IL 61801 Tel.: (217) 244-6395, Fax.: (217) 244-1946 e-mail: [email protected] September 30, 1996 Abstract Currently there are no computer-aided-design (CAD) tools dedicated to the design and synthesis of power electronic circuits. The des...