The performance data of a PV module are derived from the current-voltage characteristic measured under standard test conditions (STC). For this purpose, test laboratories as well as module production plants employ solar simulators which, depending on type and module size, display a more or less pronounced non-uniform distribution of irradiance in the test plane. In view of the quality assurance...

The non-uniformity is a time-dependent noise caused by the lack of sensor equalization. We present here the detailed algorithm and online demo of the non-uniformity correction method by midway infrared equalization. This method was designed to suit infrared images. Nevertheless, it can be applied to images produced for example by scanners, or by push-broom satellites. This single image method w...

center pivot irrigation system is used as a modern irrigation method in different parts of iran. unfortunately due to lack of proper design and hydraulic shortcomings of the system in several agricultural lands in iran, the efficiency of the center pivot irrigation system is low or unacceptable. low system efficiency results in non-uniformity of water distribution along the lateral and on the c...

In the present study, the microstructural changes of a Nickel based superalloy Nimonic80A during a non-isothermal deformation were studied. Therefore, microstructure evolutionduring hot side pressing test was predicted with combined methods of finite element analysis andprocessing map of the material. The predicted results were validated through experimentalmicrostructural studies. The results ...

this paper represents a new region-based active contour model that can be used to segment images with intensity non-uniformity and high level noise. the main idea of our proposed method is to use gaussian distributions with different means and variances with incorporation of intensity non-uniformity model for image segmentation. in order to integrate the spatial information between neighboring ...

CD-PEB temperature experiments show that post-exposure bake (PEB) temperature non-uniformity (both in steady-state and transient phases) impacts across-wafer CD uniformity [1]. Continued improvement in CD uniformity requires across-wafer temperature uniformity for the entire PEB cycle. This poses new challenges for the design of PEB thermal modules. This paper proposes a novel PEB thermal modul...