نتایج جستجو برای: parameters uncertainly
تعداد نتایج: 578758 فیلتر نتایج به سال:
Multiple sensors and sensor fusion are commonly used to get more accurate information. The intuitive method to store multi-sensory data is using uncertain database because the sensors are not precise enough. Hence, like the top-k queries in traditional database, the top-k queries in uncertain databases are quite popular and useful due to its wide application. Although there are lots of top-k qu...
BACKGROUND Serum infliximab (IFX) and antibody-to-infliximab (ATI) levels are objective parameters, that may have a great role in the therapeutic decisions during maintenance biological therapy. RESEARCH DESIGN AND METHODS 48 inflammatory bowel disease patients receiving maintenance IFX therapy were prospectively enrolled and divided into adequate (complete remission N = 20) and inadequate re...
Fluorescence interference contrast microscopy (FLIC) is a powerful method to structurally characterize fluorescent objects with nanometer-scale resolution in the z direction. Here we use FLIC to characterize the water layer underlying supported membranes and membrane-tethered double-stranded oligonucleotides. FLIC measurements of supported membranes containing the lipid-anchored fluorescent dye...
— Various model parameter calculation equations of RF CMOS inductors are compared. The calculation equations are using as variables either Y, Z-parameters or S-parameters. Results are based on on-wafer RF S-parameter measurements of a 3.75 turn spiral inductor fabricated in AMIS 0.7 μm CMOS DM1P n-well technology. Results obtained with calculation equations for a differentially driven inductor ...
We develop a covariance-matrix-based uncertainty analysis for vector-network-analyzer scattering-parameter measurements. The covariance matrix captures all of the measurement uncertainties and statistical correlations between them. This allows the uncertainties of vector-network-analyzer scattering-parameter measurements to be propagated into the uncertainties of other quantities derived from s...
An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of the S-parameters with less number of mea...
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