نتایج جستجو برای: rietveld refinement

تعداد نتایج: 34023  

2016
K. UFER R. KLEEBERG

X-ray diffraction is one of the most effective tools for the characterization of the stacking defects which occur frequently in clayminerals.Modelling of the diffraction patterns of oriented mounts is often used for obtaining structural information about the nature of stacking order. Manual matching of calculated and observed patterns is time consuming and the results are user dependent and esp...

Journal: :Acta Crystallographica Section E Crystallographic Communications 2020

Journal: :Acta Crystallographica Section A Foundations of Crystallography 2008

Journal: :Acta Crystallographica Section A Foundations of Crystallography 2011

In this research, formation of nanocrystalline Ni3Al intermetallic from Ni and Al elemental powders by mechanical alloying (MA) process and its characterization was investigated. Therefore, the evolutions in microstructure such as phase transformation, oxidation in air and introduction of Fe impurity from milling media after MA were evaluated using XRD, Rietveld refinement, TEM, SEM, EDS and IC...

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