-Anodizing of AZ 31 Mg alloy was investigate in 3M KOH solution for 10, 20 and 30min. at constant voltage of 5V. Atomic force microscope (AFM) used to investigate the roughness of anodic film formed on the surface while the scanning electron microscope (SEM) was used to determine the morphology of the anodic film, it was found that the roughness of the anodic film is mainly depend on the anodiz...

The authors present the first results obtained with their multibeam scanning electron microscope. For the first time, they were able to image 196 array of 14 14 focused beams of a multielectron beam source on a specimen using single beam scanning electron microscope SEM optics. The system consists of an FEI Novanano 200 SEM optics column equipped with a multielectron beam source module. The sou...

Secondary electrons (SE) have been for many years the most user friendly, versatile, and convenient modes of imaging in the scanning electron microscope. The Helium Ion Microscope (HIM) also generates secondary electrons (iSE) and potentially offers significant advantages compared to the conventional SEM including much enhanced spatial resolution and improved image contrast. There are, however,...

We have explored methods to achieve excellent results in study of the pollen grain wall by using only one electron microscope, the scanning electron microscope (SEM). While the secondary electron imaging mode , the most common in use, has great value in characterizing the exine surface it is possible to obtain a more comprehensive representation of pollen grain walls by expanding the capability...

Semithin sections are commonly used to examine large areas of tissue with an optical microscope, in order to locate and trim the regions that will later be studied with the electron microscope. Ideally, the observation of semithin sections would be from mesoscopic to nanoscopic scales directly, instead of using light microscopy and then electron microscopy (EM). Here we propose a method that ma...

Some novel micro/nano-moiré methods have been developed at the Failure Mechanics Lab in Tsinghua University. This paper offers an introduction of these new methods, which can be realized under focus ion beam (FIB) system,scanning electron microscope (SEM), atomic force microscope (AFM), scanning tunneling microscope(STM) as well as laser scanning confocal microscope (LSCM). These micro/nano-moi...

Electron beam techniques namely Scanning Electron Microscopy (SEM), the closely related Electron Probe Microanalysis (EPMA) and Transmission Electron Microscopy (TEM) find ample applications on the characterization of various types of geological materials including clays. They provide morphological, structural and chemical information down to the atomic scale. The principal advantage of the ele...

various compounds have been used for microencapsulating of fish oilso far, but in thiswork for the first time, inulin and casein which are both known for their functional properties, were used as the coating materialof fish oil.this study aimed to investigate the properties of nano-emulsions (droplet size measurements and ph) based on changes in the concentration and type of wall and their effe...

This paper will explore the possibilities of critical dimension scanning electron microscope (CD-SEM) metrology at sub10 nm feature sizes using modeling. JMONSEL simulations will be used to illustrate SEM waveforms for very small features, as a function of beam energy, feature size, profile height and sidewall angle. It will also be shown that the dimensions of the electron beam and interaction...