نتایج جستجو برای: scanning probe microscope

تعداد نتایج: 272834  

2000
S. R. Manalis E. B. Cooper P. Wagner D. G. Hafeman

A pH sensitive scanning probe is realized by integrating a micron-sized field-effect sensor onto a cantilever designed for an atomic force microscope. The hybrid device, called a scanning probe potentiometer ~SPP!, is capable of measuring pH gradients over a sample surface. The device was used to profile the pH across a reservoir of laminar streams created by fluid flow in an array of microflui...

2010
Feilong Lin Wes Parker Stuart T. Smith Patrick J. Moyer

OVERVIEW This abstract presents the design, performance evaluation and applications of a fast xy translation stage to create area scans of the optical spot in a metrological confocal microscope system. Scanning is achieved by moving the output of the fiber light source over an area of 60 x 60 μm that corresponds to a scan of around 5.2 μm of the spot size. The fiber scanner has a first mode res...

2002
Matthew J. Brukman Robert W. Carpick

Euler beam theory and Lagrangian mechanical analysis have been applied to the beetle-style scanning probe microscope (SPM) system to predict the natural frequencies for two significant vibrational modes. In the first mode, the three piezoelectric legs vibrate transversely and the scan head moves from side to side, and in the second, the legs bend tangentially and the scan head twists about its ...

Journal: :Ultramicroscopy 2008
A J Fleming K K Leang

Due to hysteresis exhibited by piezoelectric actuators, positioning stages in scanning probe microscopes require sensor-based closed-loop control. Although closed-loop control is effective at eliminating non-linearity at low scan speeds, the bandwidth compared to open loop is severely reduced. In addition, sensor noise significantly degrades achievable resolution in closed loop. In this work, c...

2005
Ampere A. Tseng Andrea Notargiacomo T. P. Chen

In addition to its well-known capabilities in imaging and spectroscopy, scanning probe microscopy sSPMd has recently shown great potentials for patterning of material structures in nanoscales. It has drawn the attention of not only the scientific community, but also the industry. This article examines various applications of SPM in modification, deposition, removal, and manipulation of material...

Journal: :The Review of scientific instruments 2014
E Schaefer-Nolte F Reinhard M Ternes J Wrachtrup K Kern

We present the design and performance of an ultra-high vacuum (UHV) low temperature scanning probe microscope employing the nitrogen-vacancy color center in diamond as an ultrasensitive magnetic field sensor. Using this center as an atomic-size scanning probe has enabled imaging of nanoscale magnetic fields and single spins under ambient conditions. In this article we describe an experimental s...

2006
Gajendra Shekhawat Vinayak P. Dravid

We have developed a novel scanning near-field ultrasound holography (SNFUH) technique which combines the nanometer-scale spatial resolution of conventional scanning probe microscope (SPM) with the surface and subsurface imaging capabilities [1]. This technique fills the critical void in characterization and investigation of the static and dynamic mechanics of nanoscale systems and address emerg...

2007
Gajendra Shekhawat Vinayak P. Dravid

A novel scanning near-field ultrasound holography (SNFUH) technique has been developed which combines the nanometer-scale spatial resolution of conventional scanning probe microscope (SPM) with the surface and subsurface imaging capabilities [1]. This technique fills the critical void in characterization and investigation of the static and dynamic mechanics of nanoscale systems and address emer...

Journal: :Vojnosanitetski pregled 2005
Goran Brajuskovic

The first electron microscope was designed in 1931 by Ernest Ruska, as his diploma thesis at the Faculty of Engineering in Berlin; it was designed on the bases of Busch’s theory about electronic lens. (Fg.1). The microscope had magnification of only 17 times. In his doctoral dissertation in 1933 Ernest Ruska developed a new electron microscope with three electromagnetic lenses. The magnificatio...

2003
Werner A. Hofer Adam S. Foster Alexander L. Shluger

Significant progress has been made both in experimentation and in theoretical modeling of scanning probe microscopy. The theoretical models used to analyze and interpret experimental scanning probe microscope (SPM) images and spectroscopic data now provide information not only about the surface, but also the probe tip and physical changes occurring during the scanning process. The aim of this r...

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