Control of liquid crystal (LC) orientation using a proper SiO2 alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO2 films by generalized ellipsometry as a function of deposition angle. The columnar SiO2 structure orientation measured by a noninvasive ellipsometry technique is reported for th...

Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 t...

Two different experimental approaches based on ellipsometry and zeta potential measurements have been employed to determine the dispersion and polar surface free energy components of glass. From ellipsometry the adsorption isotherms of n-octane and water have been determined, yielding values for the film pressures of n-octane and water and the dispersion and polar surface free energy components...

We apply generalized ellipsometry, well-known to be sensitive to the optical properties of anisotropic materials, to determine the amount of fibronectin protein that adsorbs onto a Ti slanted columnar thin film from solution. We find that the anisotropic optical properties of the thin film change upon organic adsorption. ...

In this paper we describe a new variant of null ellipsometry to determine thicknesses and optical properties of thin films on a substrate at cryogenic temperatures. In the PCSA arrangement of ellipsometry the polarizer and the compensator are placed before the substrate and the analyzer after it. Usually, in the null ellipsometry the polarizer and the analyzer are rotated to find the searched m...

Silica mesoporous nanocomposite films containing graphene nanosheets and gold nanoparticles have been prepared via a one-pot synthesis using silicon tetrachloride, gold(III) chloride tetrahydrate, a 1-N-vinyl-2-pyrrolidone dispersion of exfoliated graphene and Pluronic F127 as a structuring agent. The composite films have shown graphene-mediated surface-enhanced Raman scattering (G-SERS). Graph...

Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a wellcharacterized reference sample. We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spo...

Due to the small skin depth in metals at optical frequencies, their plasmonic response is strongly dictated by their surface properties. Copper (Cu) is one of the standard materials of choice for plasmonic applications, because of its high conductivity and CMOS compatibility. However, being a chemically active material, it gets easily oxidized when left in ambient environment, causing an inevit...