Most relationships between variables describing natural and behavioral phenomena are nonlinear, with U-curve and S-curve relationships being particularly common. Yet, structural equation modeling software consideration. This can lead to misleading results, particularly in multivariate and complex phenomena like those related to e-collaboration. One notable exception is WarpPLS (available from: ...

Scanning electron microscopy with energy-dispersive X-ray spectrometry (SEM-EDS) was used to characterize a macroscopic artifact from Peru (a Moche cast figure) [1]. A 3D hyperspectral datacube was acquired over 51.2 hours, measuring 11,520 x 9,984 pixels with 2,048 energy channels per pixel; each pixel corresponds to 900 nm in the x and y dimensions. With current technology, interacting with t...

The purpose of this study was to evaluate the filler compositions of recently available light-cured resins. The composition of each resin paste was evaluated using an energy dispersive X-ray fluorescence spectrometer. Scanning electron microscopic observation of the polymerized resin pastes was also conducted. The main component of each resin composite was Si, while the other elements detected ...

BACKGROUND The orthodontics industry has paid great attention to the aesthetics of orthodontic appliances, seeking to make them as invisible as possible. There are several advantages to clear aligner systems, including aesthetics, comfort, chairside time reduction, and the fact that they can be removed for meals and oral hygiene procedures. METHODS Five patients were each given a series of F2...

Recent developments in SEM column design have led to the ability to produce nm spot sizes even at high probe currents [1], thus pushing the analytical techniques available in the SEM to conduct microanalysis with nanometer resolution. Although the limitations of microanalysis at these spatial resolution requirements stem from the physics of beam-specimen interaction and the volume from which th...

Introduction “Second best no more” was the title of an article written by David C. Joy for Nature Materials [1]. The article was for highlighting a breakthrough made by a team formed between Brookhaven National Laboratory (BNL, USA) and Hitachi High Technologies Corporation (HHT, Japan). Sub-angstrom secondary electron (SE) images were obtained on a Hitachi HD-2700, which is a combined scanning...

The scanning electron microscope (SEM) has been successfully used as an analysis tool for nano-scale materials in nuclear and special materials applications for many years. Recently, the large chamber (LC) SEM at Y12 has demonstrated its power in surface analysis and inspections of large specimens at the nano-scale without destruction of the specimen. This paper summarizes the research efforts ...

We review the use of scanning electron microscopy (SEM), atomic force microscopy (AFM) and force spectroscopy (FS) for probing the ultrastructure, chemistry, physical characteristics and motion of fungal cells. When first developed, SEM was used to image fixed/dehydrated/gold coated specimens, but here we describe more recent SEM developments as they apply to fungal cells. CryoSEM offers high r...