نتایج جستجو برای: test equipment

تعداد نتایج: 879736  

Journal: :DEStech Transactions on Computer Science and Engineering 2018

Journal: :Journal of The Korean Society for Fluid Power & Construction Equipments 2014

Journal: :DEStech Transactions on Engineering and Technology Research 2017

Journal: :Journal of physics 2022

Abstract A boiler is one of the most significant components in a steam power plant system, as from used to crank turbine, which drives an electric generator. sootblower piece equipment that cleans ash and scale has built up on pipes. The heat-transfer pipes have been reduced. When soot builds or riser boiler’s walls, heat transfer impeded, resulting less transfer. amount produced by will decrea...

2003
Eric L. Smitt

Board and System test can be carried out using PXI technology that maximizes the universal nature of Virtual Instrumentation while protecting investment in capital equipment, eliminating the dedicated test equipment that is made obsolete by new product design. With an ever-increasing base of PXI equipment available to the test engineer, selection of form factor should not be made, predicated on...

2013
Sungbok Lee Alexandros Potamianos

Formant trajectories of five American English diphthongs embedded in the target words BAIT (/ei/), BITE (/ai/), POUT (/au/), BOAT (/Ou/), BOYS (/oi/) are investigated in the F1-F2 space as a function of age and gender. Age range considered is from 5 to 18 years. In this report, the focus is given to the differences in position between the start/end points of diphthongs and nine monophthons. Ave...

2011
Igor Aleksejev Sergei Devadze Artur Jutman Raimund Ubar

This work introduces a new board-level test technology based on specific synthesizable embedded instruments. The purpose of intelligent embedded instrument is to carry out a vast portion of test application related procedures, perform measurement and configuration of system components thus minimizing the usage of external test equipment. By replacing traditional test and measurement equipment w...

2001
Rainer Dorsch Hans-Joachim Wunderlich

An automatic test pattern generation (ATPG) method is presented for a scan-based test architecture which minimizes ATE storage requirements and reduces the bandwidth between the automatic test equipment (ATE) and the chip under test. To generate tailored deterministic test patterns, a standard ATPG tool performing dynamic compaction and allowing constraints on circuit inputs is used. The combin...

Journal: :Optics express 2012
Jui-Wen Pan

Modified testing equipment for adjusting the back focal length of a compact camera module (CCM) is proposed. The advantages of this modified testing equipment which includes a conversion lens are that it saves on testing space, offers a smaller sized testing chart, as well as high speed chart changing, and variable object distances. The modified testing equipment can produce a test chart of 38....

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