نتایج جستجو برای: texture profile analysis

تعداد نتایج: 3020522  

Journal: :International Journal of Solids and Structures 2016

Journal: :Computer-Aided Design 2014
Qunfen Qi Paul J. Scott Xiangqian Jiang Wenlong Lu

The optimized design and reliable measurement of surface texture are essential to guarantee the functional performance of a geometric product. Current support tools are however often limited in functionality, integrity and efficiency. In this paper, an integrated surface texture information system for design,manufacture andmeasurement, called ‘‘CatSurf’’, has been designed and developed, which ...

Journal: :SIAM J. Imaging Sciences 2011
Pierre Maurel Jean-François Aujol Gabriel Peyré

This article presents a new adaptive framework for locally parallel texture modeling. Oscillating patterns are modeled with functionals that constrain the local Fourier decomposition of the texture. We first introduce a texture functional which is a weighted Hilbert norm. The weights on the local Fourier atoms are optimized to match the local orientation and frequency of the texture. This adapt...

2017
Saeideh Ghahghaei Preeti Verghese

Attention is important for selecting targets for action. Several studies have shown that attentional selection precedes eye movements to a target, and results in an enhanced sensitivity at the saccade goal. Typically these studies have used isolated targets on blank backgrounds, which are rare in real-world situations. Here, we examine the spatial profile of sensitivity around a saccade target ...

Journal: :Journal of dairy science 2002
M H Tunick D L Van Hekken

Torsion gelometry, a fundamental rheological test in which specimens are twisted until they fracture, was applied to several different cheese varieties to determine its suitability for measuring their textural properties. Fresh and aged Brick, Cheddar, Colby, Gouda, Havarti, Mozzarella, and Romano cheeses were subjected to torsion analysis, and the results were compared with those from small am...

Journal: :Ultramicroscopy 2010
X Z Li

A computer program for the simulation of polycrystalline electron diffraction patterns is described. PCED2.0, an upgraded version of the previous JECP/PCED, can be used as a teaching aid and research tool for phase identification, microstructure texture analysis, and phase fraction determination. In addition to kinematical theory for diffraction intensity calculation of polycrystalline samples,...

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