Scanning transmission electron microscopy (STEM) is now the primary tool for exploring functional materials on atomic level. Often, features of interest are highly localized in specific regions material, such as ferroelectric domain walls, extended defects, or second phase inclusions. Selecting to image structural and chemical discovery via atomically resolved imaging has traditionally proceede...

Abstract Compressed sensing can decrease scanning transmission electron microscopy dose and scan time with minimal information loss. Traditionally, sparse scans used in compressed sample a static set of probing locations. However, dynamic that adapt to specimens are expected be able match or surpass the performance as subset possible scans. Thus, we present prototype for contiguous system piece...