CP titanium was polished with a colloidal sitica suspension and chromic ox{de slurry under low and high pressures. The polisheti surfaces wer'e characterized by means of EI]MA and XPS. Irrespeetive of polishing pressure, colloidal silica suspension suecessfully created a mirror-Iike surface that was clean at EPMA level, However, XPS detected a small amount of silicon on the outermost surface. O...

We report experimental and theoretical evidence of surface effects in the Ni 2p x-ray photoemission spectra !XPS" of NiO. The Ni 2p3/2 surface-enhanced XPS of a NiO sample show a relative enhancement of the intensity of the known satellite at 1.5 eV higher binding energy from the main line, indicating a considerable surface contribution of this satellite. The results are discussed in terms of b...

We present accurate ground-state energies for the positronium atom in a Coulomb field of point charge Z (XPs!, for the positronium hydrogen ~HPs! and positronium lithium ~LiPs! atoms. Calculations are done using the diffusion quantum Monte Carlo ~DQMC! method. For XPs, the critical value of Z for binding is examined. While HPs is stable, the results show that LiPs is unstable against dissociati...

Application specific simulation is challenging task in various real time high performance embedded devices. In this study specific application is implemented with the help of Xilinx. Xilinx provides SDK and XPS tools, XPS tools used for develop complete hardware platform and SDK provides software platform for application creation and verification. Xilinx XUP-5 board have been used and implement...

X-ray photoelectron spectroscopy (XPS) depth profiling with C60(+) sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene-poly(oligo(oxyethylene)methacrylate) (PS-POEM) copolymer. XPS depth profilin...