نتایج جستجو برای: آسیب seu

تعداد نتایج: 37468  

2007
Lin Zhang Zeqing Song

O receptor de ácido retinóico é um fator de transcrição no núcleo celular que se liga ao ácido retinóico. A esfera de atuação do ligante do receptor gama do ácido retinóico humano (seu complexo com ácido retinóico e sua interação com a proteína I ácido retinóico ligante) foi estudada por espectroscopia de massa. O caminho do ácido retinóico a partir do doador até o receptor foi monitorado on-li...

2005
DUNCAN LUCE

A detailed theoretical analysis is presented of what five utility representations – subjective expected utility (SEU), rank-dependent (cumulative or Choquet) utility (RDU), gains decomposition utility (GDU), rank weighted utility (RWU), and a configural-weight model (TAX) that we show to be equivalent to RWU – say about a series of independence properties, many of which were suggested by M. H. ...

2008
Lawrence Blume David Easley

In this chapter we survey asset pricing in dynamic economies with heterogeneous, rational traders. By ‘rational’ we mean traders whose decisions can be described by preference maximization, where preferences are restricted to those which have an subjective expected utility (SEU) representation. By ’heterogeneous” we mean SEU traders with different and distinct payoff functions, discount factors...

2011
Yoshihiro Ichinomiya Motoki Amagasaki Masahiro Iida Morihiro Kuga Toshinori Sueyoshi

SRAM-based field programmable gate arrays (FPGAs) are vulnerable to a single event upset (SEU), which can be induced by radiation effects. Although an FPGA is susceptible to SEUs, these faults can be corrected as a result of its reconfigurability. In this work, we propose techniques for SEU mitigation and recovery of a soft-core processor using triple modular redundancy (TMR) and partial reconf...

2004
J. Marley

A detailed theoretical analysis is presented of what five utility representations — subjective expected utility (SEU), rank-dependent (cumulative or Choquet) utility (RDU), gains decomposition utility (GDU), rank weighted utility (RWU), and a configural-weight model (TAX) that we show to be equivalent to RWU — say about a series of independence properties, many of which were suggested by M.H.Bi...

2003
MARCELO AZEVEDO COSTA RENATO MARTINS ASSUNÇÃO

Este artigo propõe uma análise comparativa dos métodos SCAN e BESAG&NEWELL definidos como testes genéricos de conglomerados espaciais. O objetivo do trabalho é explorar as peculiaridades de cada método avaliando o seu desempenho e o seu poder de identificação. O método BESAG&NEWELL necessita do ajuste de parâmetros por parte do usuário, sendo sensı́vel à escolha dos mesmos. O resultado final é a...

2003
K. E. Li M. A. Xapsos C. Poivey G. Maki

Radiation test results and analyses are presented for ultra-low power Reed Solomon encoder circuits that are being considered for use on the Space Technology 5 (ST5) mission. The total ionizing dose tolerance is in excess of 100 krad(Si) and is due to the low supply voltage and the use of back-bias, which suppresses radiation-induced leakage currents in the n-channel devices. The circuits do no...

1998
F. Faccio C. Detcheverry M. Huhtinen

SEU error rates in the CMS tracker environment have been approximated with Monte Carlo simulations. The estimated upset rates for a submicron technology are 8.3 10-7 upsets/(bit s) at 4.9cm and 1.1 10-8 upsets/(bit s) at 49cm from the beam line, respectively. Comparison of simulation data with experimental proton irradiation benchmarks points to a tenfold underestimate of the actual rate. All t...

2004
M RAVINDRA

Several very large scale integrated (VLSI) devices which are not available in radiation hardened version are still required to be used in spacecraft systems. Thus these components need to be tested for highenergy heavy ion irradiation to find out their tolerance and suitability in specific space applications. This paper describes the high-energy heavy ion radiation testing of VLSI devices for s...

2001
M. Ceschia M. Bellato M. Menichelli A. Papi J. Wyss A. Paccagnella

We have investigated the effects produced by exposing a Field Programmable Gate Array (FPGA) based on static RAM to an Ion Beam. Tested devices have been taken from FLEX10K family manufactured by Altera Corporation. These parts are commercial graded and not qualified for application in radioactive environments. A design based on mixed plain and Triple-Modular-Redundant (TMR) shift registers (SR...

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