To accelerate the design cycle for analog circuits and mixed-signal systems, we have proposed a top-down, constraint-driven design methodology [1]. In this paper we present a complete design flow to illustrate this design methodology as it applies to the design of a second order sigma-delta (Σ-∆) analog-to-digital (A/D) converter. We start from its performance and functional specifications and ...

Digital to analog converter is widely used mixed-signal circuit. Testing of analog and mixed signals faces lots of challenges due to the wide range of circuits and unavailability of one appropriate fault model. SAF (stuck_at_Fault), Stuck_open and stuck_short fault model at transistor level is used in this paper. Further these fault models are used to analyze the effects on the characteristics ...

This article presents an efficient method for testing large scale analog and mixed mode networks. Test equations are derived lbr a partitioned network from Krichhoff current law equations at the partition points. Voltages at the partit ion points are used to identify network pararneters. Thc method has applications to circuit modeling, fault diagnosis, testing and calibration. The conventional ...

Introduction: Similar in size Venus has been called Earth’s sister planet. However with an atmospheric pressure of 90bar and surface temperatures exceeding 460oC, the conditions on the surface of Venus are some of the most extreme in the solar system. Our desire to go to learn more about our neighboring planet is pushing the envelope for sample handling technologies. The Venusian environment is...

An approach to test optimization in switched-capacitor systems based on fault simulation at switch-level is presented in this paper. The advantage of fault simulation at this granularity level is that it facilitates test integration as early as possible in the design of these systems. Due to their mixed-signal nature, both catastrophic and parametric faults must indeed be considered for test op...

A new parametric approach for detecting defects in analog integrated circuits using the feed-forward neural network trained by back-propagation method is presented. The neural network is used for classification of tested circuits by sensing differences observed in dynamic supply current of fault-free and faulty circuits. The identification is performed in time and frequency domain, followed by ...

In the past two decades, the techniques of artificial neural networks are growing mature, as a datadriven method, which provides a totally new perspective to fault diagnosis. Testing issues are becoming more and more important with the quick development of both digital and analog circuit industry. Analog-to-digital converters (ADCs) are becoming more and more widespread owing to their fundament...

Abstract This paper describes test procedures to characterize the behavior of logarithmic analog-to-digital converters. Logarithmic A/D converters are usually characterized in terms of signal-to-noise ratio (SNR) or in deviation of the ideal characteristic in dB. There are a lack of test methods definition in the literature, as can be observed in the IEEE standard 1241 for these type of convert...