Atomic Force Microscopy (AFM) is a member of the family of Scanning Probe Microscopy, together with the Scanning Tunneling Microscopy (STM) and the Scanning Near-field Optical Microscopy (SNOM). Unlike them, however, it is also a descendent of a popular instrument from the pre-superresolution era, the Stylus Profilometer (SP). The probe tip in the AFM is analogous to the stylus in the SP, with ...

The basic principles of atomic force microscopy are discussed. Various deflection sensors are described and compared with each other. A simple theoretical basis of the fundamental forces, such as van der Waals, electrostatic, magnetic, capillary, ionic repulsion and frictional forces, is given and the relevant experimental work is summarized.

Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....

High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynamic behavior of individual biological and bio-relevant molecules at a molecular-level resolution under physiologically relevant time scales, which is the realization of a dream in life sciences. These high-speed imaging applications now extend to the cellular/bacterial systems with the use of a sm...

Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates a reservoir. The discovery wettability alteration in reservoirs, as well complications occur analysis heterogeneous sample, such shale, for instance, have prompted scientists to look the methods assessment at nanoscale. At same time, bulk techniques, which are commonly applied, USBM ...

In three experiments we measured response time (RT) and peak force (PF) to investigate the grouping of left- and right-hand key press responses in a dual-task paradigm involving two independent go/no-go tasks. Within each task, a go stimulus within one of two modalities (i.e., visual versus auditory) required a response by one hand. In Experiment 1 with simultaneous go stimuli in the two tasks,...

We report results of glass transition (T(g)) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation force microscopy (SMFM), involves measuring the temperature-dependent shear force on a tip modulated parallel to the sample surface. Using this method we have measured the surface T(g) of thin (17-500 nm) polymer films and found that T(g) is indepe...