نتایج جستجو برای: atpg

تعداد نتایج: 382  

1996
R. Ubar A. Markus G. Jervan J. Raik

A general fault model on alternative graphs (AG) was developed to cover traditional functional and gate-level fault models for digital systems. The advantage of the new approach is that a uniform fault activating procedures on AG-s are applicable for different types of traditional faults. Also, it is not needed to represent functional faults explicitly by fault lists, the faults can be derived ...

2003
Xiao Liu Michael S. Hsiao

In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally untestable transition fault , a set of illegal (unreachable) states that enable detection of is first computed. This set of undesirable illegal states is efficiently represented as a Boolean formula. Our constrained A...

2016
A. Venkata Ramana J. Anusha

---------------------------------------------------------------------***--------------------------------------------------------------------Abstract The gate level techniques are used in simulation to identify ISE’s and also these techniques are implemented based on Sequential Automatic Test Pattern Generation (ATPG). But now a day’s IC’s are very complex so by using above gate level method, it...

1997
Raghuram S. Tupuri Jacob A. Abraham

Raghuram S. Tupuri Advanced Processor Development Advanced Micro devices Austin TX 78741 Jacob A. Abraham Computer Engineering Research Center University of Texas at Austin Austin TX 78752 same coverage is obtained. Figure 1 illustrates the proposed hierarchical test generation process using a commercially available test generator. This paper describes a novel method for hierarchical functional...

2003
Xiaoliang Bai Sujit Dey Angela Krstić

As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk noise generated by coupling capacitances between wires. Test vectors that activate and propagate crosstalk noise effects are becoming an essential part of design verification and manufacturing test. However, deriving ...

2002
Bingwei Lu

Transcripts encoding ATP synthase subunit 6 (ATP6) in petunia mitochondria were shown to be edited at 15 sites, leading to 14 amino acid changes. Certain sites are partially edited, including a site that introduces a new translation termination codon that is 13 codons upstream of the genomically encoded stop codon. Transcripts lacking the new stop codon are present in an ~ 2 5 1 ratio to transc...

1998
Madhavi Karkala Nur A. Touba Hans-Joachim Wunderlich

In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random patterns. While previous work in mixed-mode BIST has focused on developing hardware schemes for more efficiently encoding a given set of deterministic patterns (generated by a conventional ATPG procedure), the approach ta...

2000
Jason Cong Wangning Long

In this paper we present the theory and the algorithms for global SPFD-based logic restructuring (GSPFD), which allows us to replace a target wire globally in the circuit (by some wire possibly far away from the target). It successfully overcomes the limitation of the existing SPFD-based rewiring methods that can only replace a wire with another having the same destination node. As a result, ou...

Journal: :Journal of Electronic Testing 2022

The outsourcing of the design and manufacturing integrated circuits has raised severe concerns about piracy Intellectual Properties illegal overproduction. Logic locking emerged as an obfuscation technique to protect outsourced chip designs, where circuit netlist is locked can only be functional once a secure key programmed. However, Boolean Satisfiability-based attacks have shown break logic l...

Journal: :International Journal of Computer and Communication Technology 2012

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