a semi-automatic 9-row transplanter for bare root seedlings has recently been developed at the isfahan center for agricultural research that plants 80 seedlings/m2 using 9 operators at a capacity of 0.3 ha/d (8 h). separating a single seedling from a bunch and dropping it into a distributer cell by hand takes 1 s on average. at a density of 700-800 thousand/ha, the travel speed should not excee...

ATPG (Automatic Test-Pattern Generation) is the process of finding an input pattern that will sensitize a specific fault, and then propagate the effect of this fault to a primary output of the device. In this paper, the algorithms of ATPG for combinational circuit are briefly introduced. It includes D-algorithm, Basic ATPG Algorithm, PODEM algorithm and testability measurements, finally the tec...

Automatic-test-pattern generation algorithms generate circuit test patterns, can identify redundant circuit logic and compare various circuit implementations. Functional test is impractical for larger circuits and E-beam testing was very expensive. To overcome the above said difficulties structural test is used. D algorithm was proposed for pattern generation but this algorithm proved to be hig...

Property-based testing implies selecting test data satisfying coverage criteria on user-specified properties. However, current automatic test data generation techniques adopt direct generate-and-test approaches for this task. In FocalTest, a testing tool designed to generate test data for programs and properties written in the functionnal language Focal, test data are generated at random and re...

This paper explores some algorithms for automatic quantization of real-valued datasets using thermometer codes for pattern classiication applications. Experimental results indicate that a relatively simple randomized thermometer code generation technique can result in quantized datasets that when used to train simple perceptrons, can yield generalization on test data that is substantially bette...

This paper outlines a general strategy for automated black-box testing of software components that includes: automatic generation of component test drivers, automatic generation of black-box test data, and automatic or semi-automatic generation of component wrappers that serve as test oracles. This research in progress unifies several threads of testing research, and preliminary work indicates ...

– Core-based testing, which is described by the proposed IEEE standard P1500, is an effective test method for Systems-on-Chip (SOC) containing embedded cores. This test method is usable for all classes of digital cores and provides solutions that allow automatic identification and configuration of testability features in SOC containing embedded cores. In this moment, IEEE P1500 is restricted to...

A new test pattern generation method for low power test is presented. The proposed method is based on the scan chain configuration after Place and Route (P&R) process. It is also based on the Weighted Transition Metric(WTM) for low power test pattern generation. It does not need to modify any design process and very easy to run. The experimental results of ISCAS 89’ benchmark circuits show the ...

This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted and faulted circuits. Second, it applies a Boolean satisjiability algorithm to the resulting formula. This approach d...

The hardware overhead and fault coverage of a circuit is an important problem in integrated circuits and systems. To overcome this problem pseudorandom built-in-self-test (BIST) generators have been widely utilized to test integrated circuits and systems. A Pseudorandom pattern generator (PRPG) is used for generating test patterns (TPG). A weighted Pseudorandom built-in-self-test (BIST) schemes...