نتایج جستجو برای: cantilever failure

تعداد نتایج: 376904  

2002
H P Lang Ch Gerber

Atomic force microscopy (AFM) is a technique to image surfaces with unprecedented vertical and lateral resolution. Many related techniques have been derived from AFM, taking advantage of local interactions between a tip on a cantilever and a surface. However, cantilevers can also be used for sensing applications. These so-called nanosensors feature extreme sensitivity for the detection of chemi...

2013
Jannis Lübbe Matthias Temmen Philipp Rahe Angelika Kühnle Michael Reichling

We critically discuss the extraction of intrinsic cantilever properties, namely eigenfrequency f n , quality factor Q n and specifically the stiffness k n of the nth cantilever oscillation mode from thermal noise by an analysis of the power spectral density of displacement fluctuations of the cantilever in contact with a thermal bath. The practical applicability of this approach is demonstrated...

2016
Ronald A. Coutu Ivan R. Medvedev Douglas T. Petkie

In this paper, a microelectromechanical system (MEMS) cantilever sensor was designed, modeled and fabricated to measure the terahertz (THz) radiation induced photoacoustic (PA) response of gases under low vacuum conditions. This work vastly improves cantilever sensitivity over previous efforts, by reducing internal beam stresses, minimizing out of plane beam curvature and optimizing beam dampin...

Journal: :Advances in transdisciplinary engineering 2023

Using ANSYS/LS-DYNA finite element analysis software, numerical simulation was conducted on the dynamic response of steel reinforced concrete column under impact loads. The effects different constraint conditions, mass, speed, and position resistance performance SRC columns were studied. results show that fixed-simple same velocity, closer to end, greater force is; Under cantilever is significa...

Journal: :Composites Part B-engineering 2022

The Mode I and II Interlaminar Fracture Toughness (IFT) of Vectran/Epoxy composite material were investigated using the Double Cantilever Beam (DCB) 4 End Notched Flexure (4ENF) methods, respectively. Due to relatively low compressive strength Vectran (<10% its tensile properties), specimens hybridised by over wrapping with T800s/M21 prevent failure during testing. Experimental results then sim...

2009
Ram Datar Seonghwan Kim Sangmin Jeon Peter Hesketh Scott Manalis Anja Boisen Thomas Thundat

Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. The MIT Faculty has made this article openly available. Please share how this access benefits you. Your story matters. Abstract Cantilever sensors have attracted considerable attention over the last decade because of their potential a...

Journal: :international journal of nano dimension 0
m. heidari mechanical engineering group, aligudarz branch, islamic azad university, aligudarz, iran

the static pull-in instability of beam-type micro-electromechanical systems is theoretically investigated. two engineering cases including cantilever and double cantilever micro-beam are considered. considering the mid-plane stretching as the source of the nonlinearity in the beam behavior, a nonlinear size-dependent euler-bernoulli beam model is used based on a modified couple stress theory, c...

In this paper, a plane quadrilateral element with rotational degrees of freedom is developed. Present formulation is based on a hybrid functional with independent boundary displacement and internal optimum strain field. All the optimality constraints, including being rotational invariant, omitting the parasitic shear error and satisfying Fliepa’s pure bending test, are considered. Moreover, the...

2015
Ann-Lauriene Haag Yoshihiko Nagai R Bruce Lennox Peter Grütter

Cantilever based sensors are a promising tool for a very diverse spectrum of biological sensors. They have been used for the detection of proteins, DNA, antigens, bacteria viruses and many other biologically relevant targets. Although cantilever sensing has been described for over 20 years, there are still no viable commercial cantilever-based sensing products on the market. Several reasons can...

2014
Win-Jin Chang Haw-Long Lee Yu-Ching Yang Kun Shan

The atomic force microscope (AFM) has become an essential tool for imaging the surface topography of conductors and insulators on a microand nanoscale level [1]. In addition, AFM has also been powerful in nanomachining [2]. Cracks may occur in the AFM cantilever during the nanomachining experiments or in the fabrication of cantilever. The cantilever with cracks will affect its performance in us...

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