This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or frequency-directed run-length (FDR) coding. Before encoding a given set of test patterns, we selectively relax some specified bits of the test patterns. By changing a specified bit with value 1 to a don't-care, two conse...

In the hot compression test friction has a detrimental influence on the flow stress through the process and therefore, correcting the deformation curve for real behavior is very important for both researchers and engineers. In this study, a series of compression tests were simulated using Abaqus software. In this study, it has been employed the Taguchi method to design experiments by the factor...

To establish the value of median nerve compression with wrist flexion as a provocative test for carpal tunnel syndrome (CTS), we performed a prospective study of 64 patients (95 hands) with CTS confirmed by electrodiagnostic studies and 50 normal subjects (96 hands). We recorded results for the common provocative tests (Tinel's percussion test, Phalen's wrist flexion test and the carpal compres...

Test power and test time have been the major issues for current scenario of VLSI testing. The test data compression is the well known method used to reduce the test time. The don’t care bit filling method can be used for effective test data compression as well as reduction in scan power. In this paper we describe the algorithm for don’t care assignment like MT(Minimum Transition)-fill technique...

background and aim: bilingualism is an important phenomenon with different effects on each aspect of language processing. auditory temporal processing is a major component of the auditory processing ability. since bilingual and monolingual individual’s brain process are different, and no studies have yet been conducted on the effect of temporal processing on speech recognition performance of az...

Reducing test data size is one of the major challenges in testing systems-on-a-chip. This problem can be solved by test compaction and/or compression techniques. Having a partially specified or relaxed test set increases the effectiveness of test compaction and compression techniques. In this paper, we propose a novel and efficient test relaxation technique for combinational and full-scan seque...

Ever-increasing test data volume and excessive test power are two of the main concerns of VLSI testing. The ‘‘don’t-care’’ bits (also known as X-bits) in given test cube can be exploited for test data compression and/or test power reduction, and these techniques may contradict to each other because the very same X-bits are likely to be used for different optimization objectives. This paper prop...

A two-level test data compression technique is presented to reduce both the test data and the test time for System on a Chip (SOC). The level one compression is achieved by Huffman coding for the entire SOC. The level two compression is achieved by broadcasting test patterns to multiple cores simultaneously. Experiments on the d695 benchmark SOC show that the test data and test time are reduced...

The proposed paper describes a compression test analysis of JBIG standard algorithm. The aim of such work is to proof the effectiveness of this standard for images acquired through scanners and processed into a printer pipeline. The main issue of printer pipelines is the necessity to use a memory buffer to store scanned images for multiple prints. This work demonstrates that for very large scal...