نتایج جستجو برای: electromigration
تعداد نتایج: 932 فیلتر نتایج به سال:
Early failure rates have increased due to reduced feature dimensions and electromigration wear-out. Periodic delay measurements can be employed to estimate the state of wear-out. Including delay measurement sensors on-chip is costly. Therefore, a method is proposed to reduce the number of measurement points. The method identifies wear-out sensitive interconnects and selects a small number of me...
R. T. Gill *, M. J. Harbottle , J. W. N. Smith & S. F. Thornton a Groundwater Protection and Restoration Group, University of Sheffield, Department of Civil & Structural Engineering, Kroto Research Institute, Sheffield, S3 7HQ, UK b. Cardiff University, School of Engineering, Queen's Buildings, The Parade. Cardiff, CF24 3AA, UK Shell Global Solutions, Lange Kleiweg 40, 2288 GK Rijswijk, The Net...
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