C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...

A Cumulative Sum (CUSUM) control chart capable of detecting changes in both the mean and the standard deviation for autocorrelated data, referred to as the Max-CUSUM chart for Autocorrelated Process chart (MCAP chart), is proposed. This chart is based on fitting a time series model to the data, and then calculating the residuals. The observations are represented as a first-order autoregressive ...

Control charts have been broadly used for monitoring the process mean and dispersion. Cumulative sum (CUSUM) and exponentially weighted moving average (EWMA) control charts are memory control charts as they utilize the past information in setting up the control structure. This makes CUSUM and EWMA-type charts good at detecting small disturbances in the process. This article proposes two new mem...

The integration of the curtailment method with control charts considerably improves detection speed by signalling an out-of-control condition prior to inspection whole sample. To date, few research works have focused on incorporation improve performance charts. Thus, this paper incorporates approach synthetic chart propose a (Curt_Syn) for detecting upward shifts in fraction non-conforming, p. ...

In this paper, a remedial measure is first proposed to eliminate the effect of autocorrelation in phase-ІІ monitoring of autocorrelated polynomial profiles, where there is a first order autoregressive (AR(1)) relation between the error terms in each profile. Then, a control chart based on the generalized linear test (GLT) is proposed to monitor the coefficients of polynomial profiles and an R-c...

C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...

Control charts are one of the tools in statistical process control widely used for monitoring, measuring, controlling, improving quality, and detecting problems processes various fields. The average run length (ARL) can be to determine efficacy a chart. In this study, we develop new modified exponentially weighted moving (EWMA) chart derive explicit formulas both two-sided ARLs p-order autoregr...

This paper develops a new multivariate control charting method for vector autocorrelated and serially correlated processes. The main idea is to propose a Bayesian multivariate local level model, which is a generalization of the Shewhart-Deming model for autocorrelated processes, in order to provide the predictive error distribution of the process and then to apply a univariate modified EWMA con...

Quick detection of an assignable cause is necessary for process accuracy with respect to the specifications. The aim this study monitor time and magnitude processes based on unit-interval data. To end, maximum exponentially weighted moving average (Max-EWMA) control chart simultaneous monitoring event proposed. be precise, beta unit gamma distributions are considered develop Max-EWMA chart. cha...