نتایج جستجو برای: nuclear energy level lifetime
تعداد نتایج: 1921134 فیلتر نتایج به سال:
Background: The earlier Atomic Bomb explosion in Hiroshima and Nagasaki, and three worth mentioning nuclear accidents - detonation at Fukushima Daiichi nuclear plant, Chernobyl nuclear fallout and an accident at Three Mile Island nuclear power plant have made us more worried about the secure exploitation of nuclear energy. The central focus of this paper is to review radiation-mediated health e...
The atomic nucleus is a complex many-body system that consists of two types of fermion (neutron and proton). They are in the strong interaction. The statistical properties of energy levels and influence of strong force between these fermions are well described by random matrix theory. Resonance of energy levels depends on the Hamiltonian symmetry placed in one of the GOE, GUE and GSE ensembles ...
Evaporation simulations are presented to illustrate the problems associated with the determination of the nuclear level density constant at high excitation energy from evaporation spectra. The methods of using either the total (whole chain) spectra or the difference (from two different initial excitation energies) spectra are discussed. Data from the study of the reaction 701 MeV 'Si+ ' Mo are ...
"It is not a wise choice!", this was the reaction of my father when I applied for nuclear medicine residency program 26 years ago. The old retired officer continued that hi-tech nuclear medicine is dependent on multiple advanced sections that may not be easily available especially in the developing countries. Now he is not alive to see that political misconducts have added fuel to the fire. Glo...
The chemical bond arises from a redistribution of electronic charge when atoms are brought in close proximity. The bond in a solid results from the superposition of charge densities of all atoms in the system. In an atom all electrons reside in their ground states at equilibrium. Only a few low lying excited states are typically accessed. The chemical bond in the solid consists of excited elect...
Emerging VLSI technologies, as well as emerging platforms, are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechanical failures at the system level, to device failures at the chip level. Techniques to provide reliable computation in the presence of failures must do so while maintaining high performance, with an e...
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