نتایج جستجو برای: ray diffraction measurement then
تعداد نتایج: 1484604 فیلتر نتایج به سال:
Interfacial strains are important factors affecting the structural and physical properties of crystalline multilayers and heterojunctions, and the performance of the devices made of multilayers used, for example, in nanowires, optoelectronic components, and many other applications. Currently existing strain measurement methods, such as grazing incidence X-ray diffraction (GIXD), cross-section t...
Our present work presents a direct association of the observed loss of shear strength in boron carbide under plane shock wave compression to amorphization in boron carbide under triaxial stress compression. This evidence is obtained from in-situ measurement of Raman, and infrared vibrational spectra of boron carbide confined in a Diamond Anvil Cell (DAC) under hydrostatic and non-hydrostatic pr...
We have conducted the first soft x-ray diffraction experiments from a bulk single crystal, studying the bilayer manganite La2-2xSr1+2xMn2O7 with x=0.475 in which we were able to access the (002) Bragg reflection using soft x rays. The Bragg reflection displays a strong resonant enhancement at the L(III) and L(II) manganese absorption edges. We demonstrate that the resonant enhancement of the ma...
Ultra-intense femtosecond X-ray pulses from X-ray lasers permit structural studies on single particles and biomolecules without crystals. We present a large data set on inherently heterogeneous, polyhedral carboxysome particles. Carboxysomes are cell organelles that vary in size and facilitate up to 40% of Earth's carbon fixation by cyanobacteria and certain proteobacteria. Variation in size hi...
stress and residual stress are the main problems in the operating performance of materials. they are the principal causes of material failure and can affect life time of component. however measurement or predictions of them are typically difficult. two common non-destructive methods, x-ray diffraction and ultrasound are not reliable methods for subsurface residual stress measurements and destru...
In this paper, ZnO thin film was prepared by sol-gel process on glass substrates. The deposited films were dried at 100 and 240 ˚C and then annealed at 300, 400 and 500 ˚C. The two-probe measurement showed that resistance of as-prepared films is very high. The KrF excimer (λ=248 nm) laser irradiation with 1000 pulses, frequency of 1 Hz and 90 mJ/cm2 energy on surface of film resulted in the re...
Within the past decade Electron Backscatter Diffraction (EBSD) has experienced wide acceptance in metallurgical and geological labs. It is a Kikuchi diffraction device based on the SEM that enables individual grain orientations, local texture, point-to-point orientation correlations, and phases to be determined routinely at a sub-grain size level on the surfaces of bulk polycrystals while explo...
ABSTXACT This paper describes the study of the possibility of x-ray stress measurement in which stresses are obtained by analyzing the whole of one diffraction ring detected with a two-dimensional x-ray detector called an imaging plate (IP). The theory of the stress determination proposed by Taira et al (1978) was shown and advanced to make measurable all plane stress components. The experiment...
in this scientific research zns nanoparticle was synthesized via precipitation method. two samples were synthesized by this method. the nanoparticle was characterized by xrd techniques, and the size and kind of crystallinity were identified by x-ray diffraction pattern as well. the size measurement has been done by using scherrer's equation. the average sizes of nanoparticles in two sample...
in this paper the reflection coefficient of electromagnetic wave incidence on the walls of the buildings and obstacles that occurs in mobile communication path was modified by solving the riccati nonlinear equations. for this purpose, the building walls are assumed inhomogeneous layers where their permittivity changes as function of the wall thickness. using this reflection coefficient, a new p...
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