Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes ...

In this article, we propose a new behavioral modeling method to reduce the running complexity and power consumption of digital predistortion (DPD) models for radio frequency amplifiers. By employing proposed method, different cross terms in DPD model can be switched dynamically real time. Each cross-term branch further choose coefficients from multiple coefficient sets, which improves performan...