نتایج جستجو برای: reflectance

تعداد نتایج: 19705  

Journal: :IEEE Transactions on Nuclear Science 1966

Journal: :international journal of advanced design and manufacturing technology 0
sayed amirabbas oloumi ahmad sabounchi ahmad sedaghat

rapid thermal processing (rtp) has become a key technology for semiconductor device manufacturing in a variety of applications, such as thermal oxidation, annealing, and thin-film growth. hence, understanding the radiative properties of silicon and other relevant materials is essential for the analysis of the thermal transport processes. we have analyzed and calculated the spectral, directional...

Journal: :Remote Sensing 2012
Hsien-Wei Chen Ke-Sheng Cheng

For satellite remote sensing, radiances received at the sensor are not only affected by the atmosphere but also by the topographic properties of the terrain surface. As a result, atmospheric correction alone does not yield output images that truly reflect terrain surface properties, namely surface reflectance (bidirectional reflectance factor, BRF) of objects on the earth surface. Following the...

2001
Ged McGunnigle Mike J. Chantler

The segmentation of rough surfaces using their reflectance properties is considered. We present a technique to estimate the orientation of surface facets whose reflectance functions are unknown. The reflectance characteristics of each facet are estimated individually allowing this technique to be applied to non-homogeneous surfaces. Non-Lambertian components are attenuated allowing shape estima...

2014
Jun Mok Ha Sung Ho Yoo Jong Hoi Cho Yong Hoon Cho Sung Oh Cho

Silicon (Si) nanostructures that exhibit a significantly low reflectance in ultraviolet (UV) and visible light wavelength regions are fabricated using a hydrogen etching process. The fabricated Si nanostructures have aperiodic subwavelength structures with pyramid-like morphologies. The detailed morphologies of the nanostructures can be controlled by changing the etching condition. The nanostru...

2009
H. S. Lim M. Z. MatJafri Mohd. Saleh

Retrieval of the surface reflectance is important in the remotely sensed data analysis to obtain the atmospheric reflectance or atmospheric correction. The relationship between visible and mid infrared reflectance over land was investigated and developed in this study. The surface reflectances of the two visible bands were measured using a handheld spectroradiometer collected around Penang Isla...

Journal: :Medical physics 2007
Cheng Chen Jun Q Lu Kai Li Suisheng Zhao R Scott Brock Xin-Hua Hu

Reflectance imaging of biological tissues with visible and near-infrared light has the significant potential to provide a noninvasive and safe imaging modality for diagnosis of dysplastic and malignant lesions in the superficial tissue layers. The difficulty in the extraction of optical and structural parameters lies in the lack of efficient methods for accurate modeling of light scattering in ...

2007
JOHN F. MUSTARD CARLE M. PIETERS

A simplified approach to the problem of determining the relative proportion of minerals in a mixture from a reflectance spectrum of the mixture is presented. Fundamental to this approach is a priori information concerning reflectance spectra of the minerals in the mixture and some estimate of the particle sizes of the mixture components. Reflectance spectra of intimate mixtures are a systematic...

2015
Kohei Arai

Method for surface reflectance estimation with MODIS by means of bi-section algorithm between MODIS and estimated radiance is proposed together with atmospheric correction with sky-radiometer data. Surface reflectance is one of MODIS products and is need to be improved its estimation accuracy. In particular the location near the skyradiometer or aeronet sites of which solar direct, aureole and ...

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