We propose to use low-coherence-length cw optical sources with a broad spectrum in heterodyne near-field scanning microscopy in order to imitate optical pulse propagation and to obtain information about spectrally variant properties of nanophotonic components. The dispersion difference in the interferometer arms for a symmetric acousto-optic modulator arrangement is shown to be negligible over ...

We have used polarized confocal Raman microspectroscopy and scanning near-field optical microscopy with a resolution of 60 nm to characterize photoinscribed grating structures of azobenzene doped polymer films on a glass support. Polarized Raman microscopy allowed determining the reorientation of the chromophores as a function of the grating phase and penetration depth of the inscribing laser i...

Near-field microscopy has been developed to characterize optical properties of materials below the diffraction limit. It consists of scanning a probe, which can be of atomic dimensions, a few nanometers above a material surface, and detecting electromagnetic interaction. The resulting near-field optical images are conventionally analyzed by means of Fourier based methods although these data are...

Scattering-type scanning near-field optical microscopy provides access to super-resolution spectroscopic imaging of the surfaces of a variety of materials and nanostructures. In addition to chemical identification, it enables observations of nano-optical phenomena, such as mid-infrared plasmons in graphene and phonon polaritons in boron nitride. Despite the high lateral spatial resolution, scat...

The optical transmission and reflection in between two metalized optical fiber tips is studied in the optical near-field and far-field domains. In addition to aluminum-coated tips for near-field scanning optical microscopy (NSOM), specifically developed gold-coated fiber tips cut by focused ion beam are investigated. Transverse transmission maps of subwavelength width clearly indicate optical n...

Limits on the effective resolution of many optical near-field experiments are investigated. The results are applicable to variants of total-internal-reflection microscopy (TIRM), photon-scanning-tunneling microscopy (PSTM), and near-field-scanning-optical microscopy (NSOM) in which the sample is weakly scattering and the direction of illumination may be controlled. Analytical expressions for th...