A flexible noise de-embedding method for on-wafer microwave measurements of silicon MOSFETs is presented in this study. We use the open, short, and thru dummy structures to subtract the parasitic effects from the probe pads and interconnects of a fixtured MOS transistor. The thru standard are used to extract the interconnect parameters for subtracting the interconnect parasitics in gate, drain,...

Recently, the use of RFID(Radio Frequency Identification) for object identification is used more often, but the tag collision problem by the use of a radio frequency still exists. Therefore, in this paper, we analyzed tag identification time to minimize tag collisions and improve tag identification time by applying various tag anti-collision algorithms in the suggested method. As a result, we d...