نتایج جستجو برای: Atomic force microscope

تعداد نتایج: 298371  

Journal: :Physical Review Letters 1986

Journal: :international journal of advanced design and manufacturing technology 0
ali kafash houshyar negin beryani saeed daneshmand

according to recent achievements in nano technology we can see its effects in different engineering fields. in nano manufacture process the first essential step is modeling coordinately in order to make it available different software are developing for this propose.  in this paper nano modeling for two papers is developed first understanding structure in nano and micro size and second simulati...

Journal: :international journal of nanoscience and nanotechnology 2014
m. h. korayem a. karimi s. sadeghzadeh

v-shaped and triangular cantilevers are widely employed in atomic force microscope (afm) imaging techniques due to their stability. for the design of vibration control systems of afm cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. a general differential quadrature element method (...

Journal: :Review of Scientific Instruments 2010

Journal: :Review of Scientific Instruments 1993

Journal: :Applied Physics Letters 2010

Journal: :Review of Scientific Instruments 2006

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