purpose: to evaluate the rate of optical coherence tomography (oct) grid decentration in a routine practice and its effect on thickness measurements methods: topcon spectral domain oct scans from various macular diseases including age related macular degeneration, diabetic macular edema, macular pucker and central serous chorioretinopathy (cscr) were studied in all patients visited during seven...

purpose : to describe the macular thickness map of iranian adult with normal retinal status as measured by cirrus’ optical coherence tomography (oct) instrument methods : in this cross-sectional study, one eye of subjects with normal ocular examination and retinal status of at least one eye were recruited. the 512×128-scan pattern and scan area of 6×6 mm2 with software version 4 protocol in cir...

purpose : to determine the nerve fiber layer and macular thickness by optical coherence tomography (oct) in emmetropic, high-myopic and high-hyperopic eyes methods : one hundred five eyes of 55 randomly selected healthy subjects between 20 and 30 years old were included in this study. the eyes were categorized in three groups (high-myopic, emmetropic and high-hyperopic) according to their cyclo...

background: headache is one of the most disturbing symptoms with common neurological signs. variations in optic nerve perfusion quality or retinal microcirculation may end up in ganglion cell damage in patients with migraine. methods: sixty patients diagnosed with migraine and thirty normal individuals were evaluated in groups including migraine with aura, migraine without aura and controls. re...

silicon thin layers are deposited on glass substrates with the thickness of 103 nm, 147 nm and 197 nm. the layers are produced with electron gun evaporation method under ultra-high vacuum condition. the optical reectance and the transmittance of produced layers were measured by using spectrophotometer. the optical functions such as, real and imaginary part of refractive index, real and imaginar...

copper sulphide (cu 2 s) thin films at different thicknesses and annealing temperatures were deposited onto glass substrate by vacuum evaporation method. xrd study reveals the phase transformation of cu     2 s film at higher thickness. optical and resistivity study show the phase transformation of the film from cu     2 s to cus when they are annealed at higher temperature. sem st...

purpose: to determine peripapillary retinal nerve fiber layer (rnfl) thickness by three-dimensional optical coherence tomography (3d-oct) in a normal iranian population and to evaluate the concordance of these measurements with those obtained by the second generation of optical coherence tomography (oct ii). methods: in a cross-sectional observational study, 96 normal iranian subjects 20-53 yea...

Abstract: Different thickness of Cu2S thin films were prepared by vacuum evaporation under a pressure of 10-6 torr at an evaporation rate of 3Å /sec. Cu2S has direct band gap energy and indirect band gap energy at 1.2eV and 1.8 eV respectively. This paper presents the analysis of structural and optical properties of the Cu2S thin film by X-ray diffractometer (XRD) and UV-Vis-NIR Spectrophotomet...

Silicon thin layers are deposited on glass substrates with the thickness of 103 nm, 147 nm and 197 nm. The layers are produced with electron gun evaporation method under ultra-high vacuum condition. The optical Reectance and the Transmittance of produced layers were measured by using spectrophotometer. The optical functions such as, real and imaginary part of refractive index, real and imaginar...