It is first pointed out that most often used reliability coefficient α and one-factor model based reliability ρ are seriously biased when unique factors are covariated. In the case, the α is no longer a lower bound of the true reliability. Use of Bollen’s formula (Bollen 1980) on reliability is highly recommended. A web-based program termed “STERA” is developed which can make stepwise reliabili...

this study was conducted to extract first, the underlying factors of home culture attachment scale (hcas) and second, to confirm these factors via structural equation modeling (sem) analysis. to meet this end, the scale was distributed to 374 english language learners in private language institutes in mashhad, iran. to determine the construct validity of the scale, exploratory factor analysis (...

the normal and lateral line cycloid scales of the native species garra rossica (nikol’skii, 1900), one of the most common and poorly known cyprinid fish in south-eastern iran have been subjected to the scanning electron microscopy technique in order to study their detailed structure. normal scale below the dorsal fin showed a clearcut demonstration between the anterior and posterior region with...

The scanning electron microscope (SEM) has been successfully used as an analysis tool for nano-scale materials in nuclear and special materials applications for many years. Recently, the large chamber (LC) SEM at Y12 has demonstrated its power in surface analysis and inspections of large specimens at the nano-scale without destruction of the specimen. This paper summarizes the research efforts ...

An R plasmid, R100-1, was mapped previously (Yoshikawa, 1974) by transduction from an integratively suppressed Hfr strain to a recipient with a mutation in gene dnaA. By this method various types of transductants of plasmid R100-1 that exist autonomously or in the integrated state were obtained. Seventy-one such transductants were used in the present study to map gene inc, which is responsible ...

3D tomographic data at various scales is increasingly available through the wide adoption of CT (Micro Computed Tomography) and FIB-SEM (Focused Ion Beam Scanning Electron Microscopy) technologies. However, upscaling these observations is very challenging. This paper provides a template of an upscaling protocol between FIB-SEM data on a micron sized sample and CT data on the same sample regio...