scanning hall probe microscopy (shpm) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. this method is based on application of the hall effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  shpm provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

scanning near-field optical microscopy (snom) is a member of scanning probe microscopes (spms) family which enables nanostructure investigation of the surfaces on a wide range of materials. in fact, snom combines the spm technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. in this paper, a qualified overview of ...

scanning impedance microscopy (sim) is one of the novel scanning probe microscopy (spm) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (c–v) behavior of the interface and ac transport properties. the sim is an ordinary afm equip...