This paper deals with the verification of efficiency of the novel on-chip OBIST (Oscillation Built-In Self Test) strategy by comparison the fault coverage in selected types of active analog integrated filters. Fault coverage obtained by OBIST approach was compared to fault coverage results obtained by the measurement and evaluation of filters’ selected parameters.

This article aims to describe the fundamentals of analog and digital testing methods to analyze the difficulties of analog testing and to develop an approach to test the analog components in a mixed signal circuit environment. Oscillation based, built-in self-test methodology for testing analog components in mixed-signal circuits, in particular, is discussed. A major advantage of the OBIST meth...

Oscillation-based testing (OBT) and built-in self-testing (OBIST) circuits enable detection of catastrophic faults in analogue RF circuits, but both are sensitive to process, voltage temperature (PVT) variation. This paper investigates 15 OBT OBIST feature extraction strategies, four approaches threshold selection, by calculating figure-of-merit (FOM) across PVT is done using a 2.4 GHz LNA <inl...

The paper deals with an oscillation based built-in self-test (OBIST) technique to test faults in complex CMOS digital circuits (CCDCs). It focuses on stuck-at-faults, open or short faults, parametric gate delay faults. The method converts complex CMOS digital circuit under test (CCDCUT) to an oscillator and the output pulses are measured for fix time duration. Discrepancy in the number of pulse...

In this paper, a method of low power analog testing is proposed. In spite of having Oscillation Based Built in Self-Test methodology (OBIST), a look up table based (LUT) low power testing approach has been proposed to find out the faulty circuit and also to sort out the particular fault location in the circuit. In this paper an operational amplifier, which is the basic building block in the ana...