نتایج جستجو برای: X-ray photoelectron spectroscopy

تعداد نتایج: 800242  

Journal: :Accounts of Chemical Research 1970

Journal: :physical chemistry research 0
ensieh ghasemian lemraski ilam university soheila sharafinia ilam university masoud alimohammadi ilam university

this paper presents a systematic study of the surface chemistry, porous texture and adsorptive characteristics of prepared new activated carbon using persian mesquite grain. several techniques and methodologies such as, proximate analysis, n2 adsorption–desorption isotherms, scanning electron microscope (sem), fourier transform infrared spectroscopy(ft-ir), x-ray diffraction (xrd), x-ray photoe...

Journal: :journal of nanostructures 2013
m. m. larijani p. balashabadi h. seyedi e. jafari-.khamse

titanium nitride-copper (tin-cu) nanocomposite films were deposited onto stainless steel substrate using hollow cathode discharge ion plating technique. the influence of cu content in the range of 2-7 at.% on the microstructure, morphology and mechanical properties of deposited films were investigated. structural properties of the films were studied by x-ray diffraction pattern. topography of t...

E. Jafari-.Khamse H. Seyedi M. M. Larijani, P. Balashabadi

Titanium nitride-Copper (TiN-Cu) nanocomposite films were deposited onto stainless steel substrate using hollow cathode discharge ion plating technique. The influence of Cu content in the range of 2-7 at.% on the microstructure, morphology and mechanical properties of deposited films were investigated. Structural properties of the films were studied by X-ray diffraction pattern. Topography of t...

2012
M. B. Hendricks P. C. Smith D. N. Ruzic J. E. Poole

Related Articles The Si3N4/TiN Interface: 4. Si3N4/TiN(001) Grown with a −250 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 62 (2012) The Si3N4/TiN Interface: 1. TiN(001) Grown and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 33 (2012) The Si3N4/TiN Interface: 5. TiN/Si3N4 Grown...

2012
A. M. Myers J. R. Doyle J. R. Abelson D. N. Ruzic

Related Articles The Si3N4/TiN Interface: 4. Si3N4/TiN(001) Grown with a −250 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 62 (2012) The Si3N4/TiN Interface: 1. TiN(001) Grown and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 33 (2012) The Si3N4/TiN Interface: 5. TiN/Si3N4 Grown...

2012
S. M. Rossnagel C. Nichols S. Hamaguchi D. Ruzic R. Turkot

Related Articles The Si3N4/TiN Interface: 4. Si3N4/TiN(001) Grown with a −250 V Substrate Bias and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 62 (2012) The Si3N4/TiN Interface: 1. TiN(001) Grown and Analyzed In situ using Angle-resolved X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 19, 33 (2012) The Si3N4/TiN Interface: 5. TiN/Si3N4 Grown...

Journal: :iranian journal of chemistry and chemical engineering (ijcce) 1994
asghar zeini isfahani m.w. roberts a.f. carley s. read

x-ray photoelectron and electron energy loss spectroscopic (xps-eels) studies reveal that the following species are present when a mixture of co2 and water vapour is exposed to the clean mg(100) surface at 110k: co3(a), c(a) ch(a), oh(a). the reactive chemisorptions of co2 and h2o vapour coadsorbed on a mg surface leads to the formation of ch bond. increasing the temperature to 400 k shows the ...

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