نتایج جستجو برای: afm

تعداد نتایج: 11335  

Journal: :international journal of advanced design and manufacturing technology 0
m. h korayem m. noroozi kh. daeinabi

abstract: application of atomic force microscope as a manipulator for pushing-based positioning of nano-particles has been of considerable interest during recent years. however a detailed modeling of the interaction forces and control on the afm tip is important for prosperous manipulation control, a reliable control of the afm tip position during the afm-based manipulation process is a main is...

2013
Hui-Wen Cheng Yuan-Chih Chang Song-Nien Tang Chi-Tsu Yuan Jau Tang Fan-Gang Tseng

This paper presents a novel method for the attachment of a 1.8-nm Au nanoparticle (Au-NP) to the tip of an atomic force microscopy (AFM) probe through the application of a current-limited bias voltage. The resulting probe is capable of picking up individual objects at the sub-4-nm scale. We also discuss the mechanisms involved in the attachment of the Au-NP to the very apex of an AFM probe tip....

2005
A. G. Onaran F. L. Degertekin G. W. Woodruff

The development of a fluid cell with an acoustic radiation pressure ARP actuator for atomic force microscopy AFM is reported. The ARP actuator uses a zinc oxide thin film transducer fabricated on a silicon substrate to generate acoustic waves in the 120–180 MHz range. These waves are coupled to the liquid and are reflected off of the AFM cantilever exerting radiation pressure to move the AFM ca...

Journal: :Journal of microscopy 2003
H G Hansma E Oroudjev S Baudrey L Jaeger

RNA molecules have been much less studied by atomic force microscopy (AFM) than have DNA molecules. In this paper, AFM imaging is presented for two different RNA molecules able to self-assemble into complex supramolecular architectures. The first one is a molecular dimer of a 230-nt RNA fragment coming from the RNA genome of a murine leukaemia virus. The monomeric RNA fragment, which appears by...

Journal: :The Review of scientific instruments 2015
Shingo Fukuda Takayuki Uchihashi Toshio Ando

In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner's fast performance, and because repeated exchange of ...

2008
Guilherme Prado Marize Silva de Oliveira Adriana Souza Lima Ana Paula Aprigio Moreira

Aflatoxin M 1 (AFM 1 ) may occur in milk and milk products, resulting from the ingestion of aflatoxin B 1 in feedstuffs by dairy cow. A total of 88 samples of Parmesan cheese marketed in Minas Gerais state, Brazil, from March 2004 to December 2004, were analyzed for AFM 1 by high-performance liquid chromatography (HPLC) with a fluorescence detector following sample clean-up using immunoaffinity...

2014
Yee Yeo

Atomic Force Microsopy (AFM) is an increasingly popular means of obtaining accurate metrological data of surface topography. The AFM measures surface topography by recording the vertical motion of a probe as it traces the profiled surface in a raster fashion. However, the metrological accuracy of AFM images is limited by image convolution between the probe tip and the sample surface. As a resul...

Amir Nili Firuzeh Nazari Gholamreza Karimi, Marziye Teimuri Mohammad Hassanzadeh

     The aim of this study was to evaluate aflatoxin M1 (AFM1) contamination in pasteurized milk samples in Mashhad, Iran. One hundred and ten milk samples from different supermarkets were collected during three months in spring and investigated by Enzyme Linked Immuno Sorbent Assay (ELISA). AFM1 was found in 100% of the milk samples. About 5.4% of the samples c...

Journal: :Physical review 2022

The cluster slave-spin method is implemented to research the ground state properties of honeycomb lattice Hubbard model with doping $\delta$ and coupling $U$ being its parameters. At half-filling, a single direct continuous phase transition between semi-metal antiferromagnetic (AFM) insulator found at $U_{\text{AFM}}=2.43t$ that in Gross-Neveu-Yukawa universality class, where relation staggered...

2007
Seizo Morita Hirofumi Yamada Toshio Ando

This article reviews recent progress in Japan in the techniques and applications of dynamic mode atomic force microscopy (AFM), specifically focusing on three topics: (1) mechanical discrimination of intermixed two-atom species and their manipulation by frequency modulation (FM) AFM under ultrahigh vacuum; (2) sub-molecular and atomic-resolution imaging in liquids by FM-AFM; and (3) high-speed ...

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