Extensive research efforts are being carried out to evaluate and improve the reliability of computing devices either through beam experiments or simulation-based fault injection. Unfortunately, it is still largely unclear which extend injection can provide an accurate error rate estimation at early stages if be used identify weakest resources in a device. The importance challenges associated wi...

A soft-input soft-output decoder based on the least mean square error (LMSE) criterion is presented and employed for iterative decoding of product codes. The residual estimation error is derived and used for analyzing the convergence of the iterative process as well as a stopping criterion. A relation between the LMSE and the MAP decoders is also established. Simulation results are presented fo...

The Field Soft Error Rate (FSER) has been determined by the Variation of the critical Charge and the measurement of the Charge collection volume determined by alpha-particle irradiation. The modelled FSER versus critical Charge dependence agrees well to the one of the Field Soft Error measurements. The results futher Show, that the irnpact of the on-chip Alpha-Particle flux tan be neglected. Q ...

OF THE THESIS Novel Flip-Flop Designs Tolerant to Soft-Errors and Crosstalk Effects by Aditya Jagirdar Thesis Director: Prof. Michael L. Bushnell The desire to make technology faster, smaller and more affordable compels us to shrink transistors further. As we realize designs with millions of transistors, most of the existing problems increase in severity and newer problems crop up. One major ne...

in this paper, based in the l ukasiewicz logic, the definition offuzzifying soft neighborhood structure and fuzzifying soft continuity areintroduced. also, the fuzzifying soft proximity spaces which are ageneralizations of the classical soft proximity spaces are given. severaltheorems on classical soft proximities are special cases of the theorems weprove in this paper.

Radiation effects account for increasing soft error occurrences in deep submicron circuits. A method for calculating an upper bound for the width of an erroneous pulse that may reach a flip flop or a primary output is presented. This is required in order to determine pulse removal (PR) circuit characteristics for error correction at each flip flop or primary output side. Key-Words: Soft errors,...

In this article, two soft error tolerant SRAM cells, the so-called RATF1 and RATF2, are proposed and evaluated. The proposed radiation hardened SRAM cells are capable of fully tolerating single event upsets (SEUs). Moreover, they show a high degree of robustness against single event multiple upsets (SEMUs). Over the previous SRAM cells, RATF1 and RATF2 offer lower area and power overhead. The H...

Channel estimate based equalizers are those for which observations of the received signal are used to estimate the channel impulse response and possibly the statistics of the interfering noise field, and these estimates are used to calculate the equalizer filter coefficients. Channel estimate based decision feedback equalizers (CE-DFE), linear MMSE equalizers (L-MMSE), and Passive Time-Reversal...