We have investigated the fabrication of α-Cr2O3(0001) thin film on a Au(111) surface and the effect of the antiferromagnetic feature of α-Cr2O3(0001) on the magnetic properties of ultrathin Co film on α-Cr2O3(0001). Highly oriented α-Cr2O3(0001) thin film is fabricated by oxidizing Cr(110) thin film grown on a Au(111) surface. Upon the oxidization of threefold symmetric Cr(110) thin film, the α...

Pentacene is one of the most studied organic semiconducting materials. While many aspects of the film formation have already been identified in very thin films, this study provides new insight into the transition from the metastable thin-film phase to bulk phase polymorphs. This study focuses on the growth behavior of pentacene within thin films as a function of film thickness ranging from 20 t...

This Communication describes the fabrication of planar structures comprising metallic features with nanometer-scale lateral dimensions in polymer prepared by sectioning a thin metallic film, embedded in a polymer matrix, in a plane perpendicular to the metallic film. This procedure converts a structure that is thin along the z-axis into a structure that is thin along the x-axis. The embedded th...

the molecular dynamic technique was used to simulate the nano-indentation test on the thin films of silver, titanium, aluminum and copper which were coated on the silicone substrate. the mechanical properties of the selected thin films were studied in terms of the temperature. the temperature was changed from 193 k to 793 k with an increment of 100 k. to investigate the effect of temperature on...

It is necessary to study the optical properties of thin films to fabricate optoelectronic and interference devices. One of the methods in thin film preparation is the spray pyrolysis technique, which involves many technical aspects for the preparation of uniform coating. In the present study, Nickel Oxide (NiO) thin film is prepared by spray pyrolysis technique. NiO thin film was deposited usin...

In this article, we report an alternative method for in situ monitoring of the thickness and refractive index of thin film during the growth process. We design a special structure with a thickness-controlled air film to simulate the process of thin film growth. The phase term of the reflected light coming from this multi-layer structure is modulated and has a strong correlation with the thickne...