The combination of ex situ X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) measurements on 2D layered copper birnessite cathode materials for lithium ion battery applications provides detailed insight into both bulk-crystalline and localized atomic structural changes resulting from electrochemically driven lithium insertion and de-insertion. Copper birnessite electrodes that had...

Thin films of ferroelectric strontium-doped lead zirconate titanate [PSZT, (Pb(0.92)Sr(0.08))(Zr(0.65)Ti(0.35))O(3)] deposited by RF magnetron sputtering have been analyzed by in situ analysis techniques. The in situ techniques employed for this study include micro-Raman spectroscopy and X-ray diffraction (XRD), and variations in thin film structure and orientations for temperatures up to 350 d...

Pressure- and temperature-induced phase transitions have been studied for more than a century but very little is known about the non-equilibrium processes by which the atoms rearrange. Shock compression generates a nearly instantaneous propagating high-pressure/temperature condition while in situ X-ray diffraction (XRD) probes the time-dependent atomic arrangement. Here we present in situ pump-...

: We have studied the effects of shutter transients (STs) in molecular beam epitaxy (MBE). Two series of samples were grown by MBE and evaluated by X-ray diffraction (XRD) and X-ray reflectivity (XRR) measurements. The effects of STs were evaluated by growth rate (GR) analysis using a combination of growth time (GT) and thickness evaluated by XRD and XRR measurements. We revealed two opposite e...

The morphology and structure of 2,2':6',2″-ternaphthalene (NNN) deposited on muscovite mica(001) substrates was investigated by scanning force microscopy (SFM) and specular X-ray diffraction measurements. Consistently, both methods reveal the coexistence of needle-like structures with a {111} contact plane and {001} orientated island-like crystallites, which are built up by almost upright stand...

We present a transmission electron microscopy ~TEM!/Rutherford backscattering spectrometry ~RBS!/x-ray-diffraction ~XRD! study of Au evaporated on crystalline organic thin films of diindenoperylene ~DIP!. Cross-sectional TEM shows that the preparation conditions of the Au film ~evaporation rate and substrate temperature! strongly determine the interfacial morphology. In situ XRD during annealin...

Pb(Zr0.52Ti0.48)O3/polycarbonate (PZT/PC) composite films with different concentration of PZT ferroelectric nanocrystals are prepared. The polarization and dielectric relaxation behavior of PZT ferroelectric nanocrystals are characterized using in situ transmittance and X-ray diffraction (XRD) measurements for the first time. It's found that 10% PZT/PC composite film has the largest orientation...

Bismuth telluride (Bi2Te3) nano particles were prepared by refluxing method in different conditions such as varying concentration of KOH and reaction timings. X-ray diffraction (XRD) and transmission electron microscopy (TEM) measurements have been performed for structural and phase formation studies. The nanoparticles are showing the same structure of bulk except broadening of peak confirmed b...

Indium tin oxide (ITO) and titanium dioxide (TiO2) anti-reflective coatings (ARCs) were deposited on a (100) P-type monocrystalline Si substrate by a radio-frequency (RF) magnetron sputtering. Polycrystalline ITO and anatase TiO2 films were obtained at room temperature (RT). The thickness of ITO (60 to 64 nm) and TiO2 (55 to 60 nm) films was optimized, considering the optical response in the 40...