: An enhancement on the method of X-ray diffraction simulations for applications using nanofocused hard X-ray beams is presented. We combine finite element method, kinematical scattering calculations, and a spot profile of the X-ray beam to simulate the diffraction of definite parts of semiconductor nanostructures. The spot profile could be acquired experimentally by X-ray ptychography. Simulat...

core-shell 12-tungstophosphoric acid/tio2 (hpw/tio2) nanoparticles at 10 and 20% of hpw have been synthesized by simple in-situ sol- gel method. characterization of the samples was carried out by x-ray diffraction (xrd), scanning electron microscopy (sem), fourier transform infrared (ftir). the x-ray diffraction patterns of as prepared solid samples, indicated characteristic peaks of titania wi...

X-ray, neutron and electron diffraction methods are widely used for the investigation of crystals. Each of these techniques has their own advantages in terms of element sensitivity, sample size requirements etc. and are chosen accordingly for structure determinations. A less obvious difference lies in the spatial resolution of these diffraction techniques. Here, we show that electron diffractio...

A century has passed since the first X-ray diffraction experiment (Friedrich et al. 1912). During this time, X-ray diffraction has become a commonly used technique for the identification and characterization of materials and the field has seen continuous development. Advances in the theory of diffraction, in the generation of X-rays, in techniques and data analysis tools changed the ways X-ray ...

Monte Carlo ray tracing programs are now being used to solve many optical analysis problems in which the entire optomechanical system must be considered. In many analyses, it is desired to consider the effects of diffraction by mechanical edges. Smoothly melding the effects of diffraction, a wave phenomenon, into a ray-tracing program is a significant technical challenge. This paper discusses t...

236-1 Fig.1 Schematic drawing of the apparatus for X-ray diffraction experiment. (A) Specimen was placed between two parallel discs, one of which was rotated with a constant rate (0-5 s) Through a chamber window made of Kapton film, X-ray beam was introduced through the specimen suspension and diffraction signals from aligned filaments were recorded with a Hamamatsu cooled CCD camera (camera le...

Diffraction gratings are used in optical communications devices, spectrographs, optical scanners, monochromators, and in other instances. Diffraction gratings are either transmission or reflection. Reflective gratings are, usually, either ruled or holographic. Blazed gratings (step-echelette or phase gratings) are non-planar gratings. We present the fabrication of blazed diffraction gratings us...

in this article vanadium boride nanopowder was synthesized by mechanochemical reduction method in a high-energy ball mill. the synthesized powders were studied by x-ray diffraction (xrd), scanning electron microscopy (sem), xray map and transmission electron microscopy (tem). according to x-ray diffraction the product predominantly consists of vb phases after 100 min milling without further hea...

solid solutions of ag-cu were prepared via ball milling process, for about 5-30 h. the cu-20at%ag and cu-3.64at%ag composition were investigated by x-ray diffraction technique. it was realized that the solid solubility level could be increased by increasing the initial solute content in the mixture. in addition, shifts in peak positions of silver and copper were observed with milling time. the ...

tellurium nanostructures have been prepared by physical vapor deposition method in a tube furnace. the experiments were carried out under argon gas flow at a pressure of 1 mbar. tellurium powder was evaporated by heating at 350°c and 430°c and was condensed on substrates at 110–250°c, in the downstream of argon gas flow. the products were characterized by field emission scanning electron micros...