A first-order mechanistic model for architectural vulnerability factor
نویسندگان
چکیده
منابع مشابه
Measuring Architectural Vulnerability Factors
The continuous exponential growth in transistors per chip as described by Moore’s law has spurred tremendous progress in the functionality and performance of semiconductor devices, particularly microprocessors. At the same time, each succeeding technology generation has introduced new obstacles to maintaining this growth rate. Transient faults caused by single-event upsets have emerged as a key...
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ژورنال
عنوان ژورنال: ACM SIGARCH Computer Architecture News
سال: 2012
ISSN: 0163-5964
DOI: 10.1145/2366231.2337191