A Method of X-Ray Stress Measurement of Silicon Single Crystal

X-ray Stress Measurement of Nickel-base Single Crystal Superalloy Using Two-dimensional Detector

The stress in a single crystal of nickel-base superalloy with 72 % volume fraction of '-phase was measured by the X-ray method. The specimen whose surface normal was parallel to [001] direction was oscillated around -axis during recording of the X-ray diffraction pattern with a two-dimensional position sensitive proportional counter (PSPC). The stress was determined from the measured strain u...

Single Crystal Orientation Measurement by X-ray Methods

Semiconductor substrates made from single crystal materials need to be cut precisely along a fixed axis during the manufacturing process of the semiconductor components. Thus, measuring the crystal orientation is critical. For these measurements, Xray techniques demonstrate the highest precision. This report presents an outline of two popular X-ray diffraction techniques, the diffractometer and...

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چکیده ندارد.

X-Ray, Crystal Structure and Solution Phase Studies of a Polymeric SrII Compound

In the crystal structure of the title polymeric compound, [C42H38N6O33Sr5.2(H2O)]n, five independent metal atoms (Sr1-Sr5) have different coordination environments. The Sr1 and Sr5 atoms are nine coordinated and feature distorted tricapped trigonal-prismatic and capped square-antiprismatic geometries, respectively....

Live X-Ray Topography and Crystal Growth of Silicon