A Survey of Methods and Tools for Test Program Generation for Microprocessors
نویسندگان
چکیده
منابع مشابه
Combinatorial Model-Based Test Program Generation for Microprocessors
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Functional Self-Test Generation for Superscalar Microprocessors
Functional testing of microprocessors has been studied for over two decades. Techniques for generating functional tests for modern microprocessors with cache/MMU and pipelining have been previously proposed [4, 1]. However there are no reported techniques for automatic functional self-test generation for superscalar processors. We present such a technique that not only makes it possible to run ...
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ژورنال
عنوان ژورنال: Proceedings of the Institute for System Programming of the RAS
سال: 2017
ISSN: 2079-8156,2220-6426
DOI: 10.15514/ispras-2017-29(1)-11