Access Time Analysis for IEEE P1687
نویسندگان
چکیده
منابع مشابه
3D Design For Test Architectures Based on IEEE P1687
3D stacked integrated circuits based on Through Silicon Vias (TSV) are promising with their high performances and small form factor. However, these circuits present many test issues. In this paper we propose a novel 3D Design for Test (DFT) architecture based on IEEE P1687. The proposed test architecture enables test at all 3D fabrication levels: pre, mid, and post-bond levels. We discuss 3 DFT...
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Analysis and Optimization for Testing Using IEEE P 1687
The IEEE P1687 (IJTAG) standard proposal aims at providing a standardized interface between on-chip embedded test, debug and monitoring logic (instruments), such as scan-chains and temperature sensors, and the Test Access Port of IEEE Standard 1149.1 mainly used for board test. A key feature in P1687 is to include Segment Insertion Bits (SIBs) in the scan path. SIBs make it possible to construc...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computers
سال: 2012
ISSN: 0018-9340
DOI: 10.1109/tc.2011.155